Surface Functionalization of Substrate-Transferred Graphene for Electronic Applications

The quality of graphene may be of utmost importance for various applications in electronics demanding perfect electric contacts as well as for many topics of physical research. However, atomic-scale exploration reveals the presence of organic residues which were introduced during the transfer proces...

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Veröffentlicht in:ACS applied nano materials 2023-05, Vol.6 (9), p.7629-7636
Hauptverfasser: Yu, Jing-jiang, Muto, Atsushi, Kilcrease, James, Sunaoshi, Takeshi, Nozaki, Sadatsugu, Rzhevskii, Alexander, Chahid, Sara, Dulal, Rajendra, Teknowijoyo, Serafim, Gulian, Armen
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container_end_page 7636
container_issue 9
container_start_page 7629
container_title ACS applied nano materials
container_volume 6
creator Yu, Jing-jiang
Muto, Atsushi
Kilcrease, James
Sunaoshi, Takeshi
Nozaki, Sadatsugu
Rzhevskii, Alexander
Chahid, Sara
Dulal, Rajendra
Teknowijoyo, Serafim
Gulian, Armen
description The quality of graphene may be of utmost importance for various applications in electronics demanding perfect electric contacts as well as for many topics of physical research. However, atomic-scale exploration reveals the presence of organic residues which were introduced during the transfer process of the graphene layer from the substrate of growth (mostly metallic ones) onto the dielectric substrates required in electronics. Organic contamination can also be generated during experiments, as well as by atmospheric influence during storage. We explored the elimination of these unwanted layers (which are undetectable by the usual Raman spectroscopy) via treatment at various temperatures and vacuum levels. Comparative diagnostics were performed via AFM, with the best results obtained in samples treated near 400 °C.
doi_str_mv 10.1021/acsanm.3c00783
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fullrecord <record><control><sourceid>acs_cross</sourceid><recordid>TN_cdi_crossref_primary_10_1021_acsanm_3c00783</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>a283065450</sourcerecordid><originalsourceid>FETCH-LOGICAL-a229t-c88513b9182d302344a1c6028b00211087fb8a0b2251cf4eb941e74596f5b5b43</originalsourceid><addsrcrecordid>eNp1kE1Lw0AQhhdRsNRePe9ZSJ39SLM5ltJWoeChFY9hdruLKWkSZpOD_npT04MXT_MyzDPwPow9CpgLkOIZXcT6PFcOIDPqhk1kmukE8gxu_-R7NovxBAAiFwsFMGEf-54COs83fe26sqmxKr_xEngT-L63sSPsfHIgrGPwRP7It4Ttp689Dw3xdeVdR01dOr5s26p0v3B8YHcBq-hn1zll75v1YfWS7N62r6vlLkEp8y5xxqRC2VwYeVQgldYo3AKksTC0EmCyYA2ClTIVLmhvcy18ptN8EVKbWq2mbD7-ddTESD4ULZVnpK9CQHExU4xmiquZAXgagWFfnJqehsbxv-MfoypmNw</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Surface Functionalization of Substrate-Transferred Graphene for Electronic Applications</title><source>American Chemical Society Journals</source><creator>Yu, Jing-jiang ; Muto, Atsushi ; Kilcrease, James ; Sunaoshi, Takeshi ; Nozaki, Sadatsugu ; Rzhevskii, Alexander ; Chahid, Sara ; Dulal, Rajendra ; Teknowijoyo, Serafim ; Gulian, Armen</creator><creatorcontrib>Yu, Jing-jiang ; Muto, Atsushi ; Kilcrease, James ; Sunaoshi, Takeshi ; Nozaki, Sadatsugu ; Rzhevskii, Alexander ; Chahid, Sara ; Dulal, Rajendra ; Teknowijoyo, Serafim ; Gulian, Armen</creatorcontrib><description>The quality of graphene may be of utmost importance for various applications in electronics demanding perfect electric contacts as well as for many topics of physical research. However, atomic-scale exploration reveals the presence of organic residues which were introduced during the transfer process of the graphene layer from the substrate of growth (mostly metallic ones) onto the dielectric substrates required in electronics. Organic contamination can also be generated during experiments, as well as by atmospheric influence during storage. We explored the elimination of these unwanted layers (which are undetectable by the usual Raman spectroscopy) via treatment at various temperatures and vacuum levels. Comparative diagnostics were performed via AFM, with the best results obtained in samples treated near 400 °C.</description><identifier>ISSN: 2574-0970</identifier><identifier>EISSN: 2574-0970</identifier><identifier>DOI: 10.1021/acsanm.3c00783</identifier><language>eng</language><publisher>American Chemical Society</publisher><ispartof>ACS applied nano materials, 2023-05, Vol.6 (9), p.7629-7636</ispartof><rights>2023 American Chemical Society</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-a229t-c88513b9182d302344a1c6028b00211087fb8a0b2251cf4eb941e74596f5b5b43</cites><orcidid>0000-0002-4695-4059</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://pubs.acs.org/doi/pdf/10.1021/acsanm.3c00783$$EPDF$$P50$$Gacs$$H</linktopdf><linktohtml>$$Uhttps://pubs.acs.org/doi/10.1021/acsanm.3c00783$$EHTML$$P50$$Gacs$$H</linktohtml><link.rule.ids>314,776,780,2752,27053,27901,27902,56713,56763</link.rule.ids></links><search><creatorcontrib>Yu, Jing-jiang</creatorcontrib><creatorcontrib>Muto, Atsushi</creatorcontrib><creatorcontrib>Kilcrease, James</creatorcontrib><creatorcontrib>Sunaoshi, Takeshi</creatorcontrib><creatorcontrib>Nozaki, Sadatsugu</creatorcontrib><creatorcontrib>Rzhevskii, Alexander</creatorcontrib><creatorcontrib>Chahid, Sara</creatorcontrib><creatorcontrib>Dulal, Rajendra</creatorcontrib><creatorcontrib>Teknowijoyo, Serafim</creatorcontrib><creatorcontrib>Gulian, Armen</creatorcontrib><title>Surface Functionalization of Substrate-Transferred Graphene for Electronic Applications</title><title>ACS applied nano materials</title><addtitle>ACS Appl. Nano Mater</addtitle><description>The quality of graphene may be of utmost importance for various applications in electronics demanding perfect electric contacts as well as for many topics of physical research. However, atomic-scale exploration reveals the presence of organic residues which were introduced during the transfer process of the graphene layer from the substrate of growth (mostly metallic ones) onto the dielectric substrates required in electronics. Organic contamination can also be generated during experiments, as well as by atmospheric influence during storage. We explored the elimination of these unwanted layers (which are undetectable by the usual Raman spectroscopy) via treatment at various temperatures and vacuum levels. Comparative diagnostics were performed via AFM, with the best results obtained in samples treated near 400 °C.</description><issn>2574-0970</issn><issn>2574-0970</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2023</creationdate><recordtype>article</recordtype><recordid>eNp1kE1Lw0AQhhdRsNRePe9ZSJ39SLM5ltJWoeChFY9hdruLKWkSZpOD_npT04MXT_MyzDPwPow9CpgLkOIZXcT6PFcOIDPqhk1kmukE8gxu_-R7NovxBAAiFwsFMGEf-54COs83fe26sqmxKr_xEngT-L63sSPsfHIgrGPwRP7It4Ttp689Dw3xdeVdR01dOr5s26p0v3B8YHcBq-hn1zll75v1YfWS7N62r6vlLkEp8y5xxqRC2VwYeVQgldYo3AKksTC0EmCyYA2ClTIVLmhvcy18ptN8EVKbWq2mbD7-ddTESD4ULZVnpK9CQHExU4xmiquZAXgagWFfnJqehsbxv-MfoypmNw</recordid><startdate>20230512</startdate><enddate>20230512</enddate><creator>Yu, Jing-jiang</creator><creator>Muto, Atsushi</creator><creator>Kilcrease, James</creator><creator>Sunaoshi, Takeshi</creator><creator>Nozaki, Sadatsugu</creator><creator>Rzhevskii, Alexander</creator><creator>Chahid, Sara</creator><creator>Dulal, Rajendra</creator><creator>Teknowijoyo, Serafim</creator><creator>Gulian, Armen</creator><general>American Chemical Society</general><scope>AAYXX</scope><scope>CITATION</scope><orcidid>https://orcid.org/0000-0002-4695-4059</orcidid></search><sort><creationdate>20230512</creationdate><title>Surface Functionalization of Substrate-Transferred Graphene for Electronic Applications</title><author>Yu, Jing-jiang ; Muto, Atsushi ; Kilcrease, James ; Sunaoshi, Takeshi ; Nozaki, Sadatsugu ; Rzhevskii, Alexander ; Chahid, Sara ; Dulal, Rajendra ; Teknowijoyo, Serafim ; Gulian, Armen</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-a229t-c88513b9182d302344a1c6028b00211087fb8a0b2251cf4eb941e74596f5b5b43</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2023</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Yu, Jing-jiang</creatorcontrib><creatorcontrib>Muto, Atsushi</creatorcontrib><creatorcontrib>Kilcrease, James</creatorcontrib><creatorcontrib>Sunaoshi, Takeshi</creatorcontrib><creatorcontrib>Nozaki, Sadatsugu</creatorcontrib><creatorcontrib>Rzhevskii, Alexander</creatorcontrib><creatorcontrib>Chahid, Sara</creatorcontrib><creatorcontrib>Dulal, Rajendra</creatorcontrib><creatorcontrib>Teknowijoyo, Serafim</creatorcontrib><creatorcontrib>Gulian, Armen</creatorcontrib><collection>CrossRef</collection><jtitle>ACS applied nano materials</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Yu, Jing-jiang</au><au>Muto, Atsushi</au><au>Kilcrease, James</au><au>Sunaoshi, Takeshi</au><au>Nozaki, Sadatsugu</au><au>Rzhevskii, Alexander</au><au>Chahid, Sara</au><au>Dulal, Rajendra</au><au>Teknowijoyo, Serafim</au><au>Gulian, Armen</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Surface Functionalization of Substrate-Transferred Graphene for Electronic Applications</atitle><jtitle>ACS applied nano materials</jtitle><addtitle>ACS Appl. Nano Mater</addtitle><date>2023-05-12</date><risdate>2023</risdate><volume>6</volume><issue>9</issue><spage>7629</spage><epage>7636</epage><pages>7629-7636</pages><issn>2574-0970</issn><eissn>2574-0970</eissn><abstract>The quality of graphene may be of utmost importance for various applications in electronics demanding perfect electric contacts as well as for many topics of physical research. However, atomic-scale exploration reveals the presence of organic residues which were introduced during the transfer process of the graphene layer from the substrate of growth (mostly metallic ones) onto the dielectric substrates required in electronics. Organic contamination can also be generated during experiments, as well as by atmospheric influence during storage. We explored the elimination of these unwanted layers (which are undetectable by the usual Raman spectroscopy) via treatment at various temperatures and vacuum levels. Comparative diagnostics were performed via AFM, with the best results obtained in samples treated near 400 °C.</abstract><pub>American Chemical Society</pub><doi>10.1021/acsanm.3c00783</doi><tpages>8</tpages><orcidid>https://orcid.org/0000-0002-4695-4059</orcidid></addata></record>
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url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-04T10%3A15%3A35IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-acs_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Surface%20Functionalization%20of%20Substrate-Transferred%20Graphene%20for%20Electronic%20Applications&rft.jtitle=ACS%20applied%20nano%20materials&rft.au=Yu,%20Jing-jiang&rft.date=2023-05-12&rft.volume=6&rft.issue=9&rft.spage=7629&rft.epage=7636&rft.pages=7629-7636&rft.issn=2574-0970&rft.eissn=2574-0970&rft_id=info:doi/10.1021/acsanm.3c00783&rft_dat=%3Cacs_cross%3Ea283065450%3C/acs_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true