Degradation of Perovskite Photovoltaics Manifested in the Cross-Sectional Potential Profile Studied by Quantitative Kelvin Probe Force Microscopy
Kelvin probe force microscopy has been employed to monitor the cross-sectional potential profile in lead-halide perovskite photovoltaic cells. From systematic investigations on many devices under varying bias voltage and light illumination conditions, we are able to deduce quantitative profile featu...
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| Veröffentlicht in: | ACS applied energy materials 2022-04, Vol.5 (4), p.4232-4239 |
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| creator | Hiraoka, Maki Ishida, Nobuyuki Matsushita, Akio Uchida, Ryusuke Sekimoto, Takeyuki Yamamoto, Teruaki Matsui, Taisuke Kaneko, Yukihiro Miyano, Kenjiro Yanagida, Masatoshi Shirai, Yasuhiro |
| description | Kelvin probe force microscopy has been employed to monitor the cross-sectional potential profile in lead-halide perovskite photovoltaic cells. From systematic investigations on many devices under varying bias voltage and light illumination conditions, we are able to deduce quantitative profile features with low noise that allows us to compare the local electronic properties in the working devices against numerical calculations. We applied the technique to devices before and after degradation. Through the profile change before and after, we located the degraded components and inferred the source of the loss of the performance. |
| doi_str_mv | 10.1021/acsaem.1c03747 |
| format | Article |
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Energy Mater</addtitle><date>2022-04-25</date><risdate>2022</risdate><volume>5</volume><issue>4</issue><spage>4232</spage><epage>4239</epage><pages>4232-4239</pages><issn>2574-0962</issn><eissn>2574-0962</eissn><abstract>Kelvin probe force microscopy has been employed to monitor the cross-sectional potential profile in lead-halide perovskite photovoltaic cells. From systematic investigations on many devices under varying bias voltage and light illumination conditions, we are able to deduce quantitative profile features with low noise that allows us to compare the local electronic properties in the working devices against numerical calculations. We applied the technique to devices before and after degradation. 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| title | Degradation of Perovskite Photovoltaics Manifested in the Cross-Sectional Potential Profile Studied by Quantitative Kelvin Probe Force Microscopy |
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