Investigation of Vertical Current Phenomena in the Insulator/Oxide Semiconductor Heterojunction Using XPS Analysis and an Atmospheric-Pressure Plasma Treatment System

Transferring charge carriers through an insulator film between two metal electrodes is a major issue in various electronic devices, including metal/insulator/metal (MIM) diodes and resistive switching memories. Recently, a concept has been proposed that can unidirectionally control the direction and...

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Veröffentlicht in:	ACS applied electronic materials 2019-08, Vol.1 (8), p.1698-1704
Hauptverfasser:	Cho, Nam-Kwang, Park, Jintaek, Lee, Donggun, Park, Jun-Woo, Lee, Won Hyung, Kim, Youn Sang
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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