Cross calibration of secondary ion mass spectrometers
It is known from previous round-robin experiments that relative sensitivity factors, obtained on identical samples by different SIMS instruments, frequently disagree by a factor of up to 50. A method is suggested for cross-calibrating instruments in such a way that relative elemental sensitivity fac...
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| Veröffentlicht in: | Anal. Chem.; (United States) 1985-07, Vol.57 (8), p.1636-1643 |
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| container_title | Anal. Chem.; (United States) |
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| creator | Ruedenauer, Friedrich Steiger, Wolfgang Riedel, Miklos Beske, Horst E Holzbrecher, Horst Gericke, Michael Richter, Carl Ernst Rieth, Michael Trapp, Manfred et al, . |
| description | It is known from previous round-robin experiments that relative sensitivity factors, obtained on identical samples by different SIMS instruments, frequently disagree by a factor of up to 50. A method is suggested for cross-calibrating instruments in such a way that relative elemental sensitivity factors determined on one SIMS instrument may be used on another instrument for quantification of unknown samples. The method consists in actively tuning the operating parameters of instruments in such a way that relative sensitivity factors for B and W (with respect to Fe) in a homogeneous B/sub 15/Fe/sub 75/W/sub 10/ metallic glass sample (primary calibration standard, PCS) are in close agreement on all participating instruments. In an experimental in which this cross-calibration strategy has been adopted, relative sensitivity factors of seven further elements, determined on seven different SIMS instruments (including ion microscopes, ion microprobes, and quadrupole-SIMS), agree within a factor of the order of 1.7. Improvements may be expected with better tuning to the PCS. 11 references, 3 figures, 8 tables. |
| doi_str_mv | 10.1021/ac00285a030 |
| format | Article |
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A method is suggested for cross-calibrating instruments in such a way that relative elemental sensitivity factors determined on one SIMS instrument may be used on another instrument for quantification of unknown samples. The method consists in actively tuning the operating parameters of instruments in such a way that relative sensitivity factors for B and W (with respect to Fe) in a homogeneous B/sub 15/Fe/sub 75/W/sub 10/ metallic glass sample (primary calibration standard, PCS) are in close agreement on all participating instruments. In an experimental in which this cross-calibration strategy has been adopted, relative sensitivity factors of seven further elements, determined on seven different SIMS instruments (including ion microscopes, ion microprobes, and quadrupole-SIMS), agree within a factor of the order of 1.7. Improvements may be expected with better tuning to the PCS. 11 references, 3 figures, 8 tables.</description><identifier>ISSN: 0003-2700</identifier><identifier>EISSN: 1520-6882</identifier><identifier>DOI: 10.1021/ac00285a030</identifier><identifier>CODEN: ANCHAM</identifier><language>eng</language><publisher>Washington, DC: American Chemical Society</publisher><subject>400104 - Spectral Procedures- (-1987) ; BORON ; CALIBRATION ; CALIBRATION STANDARDS ; Catalysis ; Catalysts: preparations and properties ; Catalytic reactions ; CHEMICAL ANALYSIS ; Chemistry ; CHROMIUM ; DATA ; ELEMENTS ; Exact sciences and technology ; EXPERIMENTAL DATA ; General and physical chemistry ; General. Nomenclature, chemical documentation, computer chemistry ; GLASS ; INFORMATION ; INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY ; ION MICROPROBE ANALYSIS ; IRON ; MASS SPECTROMETERS ; MASS SPECTROSCOPY ; MEASURING INSTRUMENTS ; METALS ; MICROANALYSIS ; NICKEL ; NIOBIUM ; NONDESTRUCTIVE ANALYSIS ; NUMERICAL DATA ; QUANTITATIVE CHEMICAL ANALYSIS ; SEMIMETALS ; SENSITIVITY ; SPECTROMETERS ; SPECTROSCOPY ; TANTALUM ; Theory of reactions, general kinetics ; Theory of reactions, general kinetics. Catalysis. Nomenclature, chemical documentation, computer chemistry ; TRANSITION ELEMENTS ; TUNGSTEN ; VANADIUM ; ZIRCONIUM</subject><ispartof>Anal. 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Chem.; (United States)</title><addtitle>Anal. Chem</addtitle><description>It is known from previous round-robin experiments that relative sensitivity factors, obtained on identical samples by different SIMS instruments, frequently disagree by a factor of up to 50. A method is suggested for cross-calibrating instruments in such a way that relative elemental sensitivity factors determined on one SIMS instrument may be used on another instrument for quantification of unknown samples. The method consists in actively tuning the operating parameters of instruments in such a way that relative sensitivity factors for B and W (with respect to Fe) in a homogeneous B/sub 15/Fe/sub 75/W/sub 10/ metallic glass sample (primary calibration standard, PCS) are in close agreement on all participating instruments. In an experimental in which this cross-calibration strategy has been adopted, relative sensitivity factors of seven further elements, determined on seven different SIMS instruments (including ion microscopes, ion microprobes, and quadrupole-SIMS), agree within a factor of the order of 1.7. Improvements may be expected with better tuning to the PCS. 11 references, 3 figures, 8 tables.</description><subject>400104 - Spectral Procedures- (-1987)</subject><subject>BORON</subject><subject>CALIBRATION</subject><subject>CALIBRATION STANDARDS</subject><subject>Catalysis</subject><subject>Catalysts: preparations and properties</subject><subject>Catalytic reactions</subject><subject>CHEMICAL ANALYSIS</subject><subject>Chemistry</subject><subject>CHROMIUM</subject><subject>DATA</subject><subject>ELEMENTS</subject><subject>Exact sciences and technology</subject><subject>EXPERIMENTAL DATA</subject><subject>General and physical chemistry</subject><subject>General. Nomenclature, chemical documentation, computer chemistry</subject><subject>GLASS</subject><subject>INFORMATION</subject><subject>INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY</subject><subject>ION MICROPROBE ANALYSIS</subject><subject>IRON</subject><subject>MASS SPECTROMETERS</subject><subject>MASS SPECTROSCOPY</subject><subject>MEASURING INSTRUMENTS</subject><subject>METALS</subject><subject>MICROANALYSIS</subject><subject>NICKEL</subject><subject>NIOBIUM</subject><subject>NONDESTRUCTIVE ANALYSIS</subject><subject>NUMERICAL DATA</subject><subject>QUANTITATIVE CHEMICAL ANALYSIS</subject><subject>SEMIMETALS</subject><subject>SENSITIVITY</subject><subject>SPECTROMETERS</subject><subject>SPECTROSCOPY</subject><subject>TANTALUM</subject><subject>Theory of reactions, general kinetics</subject><subject>Theory of reactions, general kinetics. Catalysis. Nomenclature, chemical documentation, computer chemistry</subject><subject>TRANSITION ELEMENTS</subject><subject>TUNGSTEN</subject><subject>VANADIUM</subject><subject>ZIRCONIUM</subject><issn>0003-2700</issn><issn>1520-6882</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1985</creationdate><recordtype>article</recordtype><recordid>eNpt0M9LwzAUB_AgCs7pyX-giOBBqu8lTdIcZfMnAxWn15CmCXZu7Ugq6H9vRmV4MJeE5JPH9z1CjhEuECheGgtAS26AwQ4ZIaeQi7Kku2QEACynEmCfHMS4AEAEFCPCJ6GLMbNm2VTB9E3XZp3PorNdW5vwnW0uViaJuHa2D93K9S7EQ7LnzTK6o999TF5vrueTu3z2eHs_uZrlhnHZ51IIrGVZ1FJWWFVeeSokReaRKs-4t0oJUOnMKXO0Rs8R6-RMWkzUNRuTk6FuF_tGR9v0zr6naG3KonlBC4FlQucDsptWgvN6HZpVCq8R9GYs-s9Ykj4d9NrE1LUPprVN3H4pCyVQicTygTWxd1_bZxM-tJBMcj1_etFSPczfyuepniZ_Nnhjo150n6FNc_k3wA94CHxm</recordid><startdate>19850701</startdate><enddate>19850701</enddate><creator>Ruedenauer, Friedrich</creator><creator>Steiger, Wolfgang</creator><creator>Riedel, Miklos</creator><creator>Beske, Horst E</creator><creator>Holzbrecher, Horst</creator><creator>Gericke, Michael</creator><creator>Richter, Carl Ernst</creator><creator>Rieth, Michael</creator><creator>Trapp, Manfred</creator><creator>et al, .</creator><general>American Chemical Society</general><scope>BSCLL</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>OTOTI</scope></search><sort><creationdate>19850701</creationdate><title>Cross calibration of secondary ion mass spectrometers</title><author>Ruedenauer, Friedrich ; Steiger, Wolfgang ; Riedel, Miklos ; Beske, Horst E ; Holzbrecher, Horst ; Gericke, Michael ; Richter, Carl Ernst ; Rieth, Michael ; Trapp, Manfred ; et al, .</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-a357t-7661d784d77b1bbf9f267213f129f35fc9960929f523e2d1f511dbbfaaaa36dd3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1985</creationdate><topic>400104 - Spectral Procedures- (-1987)</topic><topic>BORON</topic><topic>CALIBRATION</topic><topic>CALIBRATION STANDARDS</topic><topic>Catalysis</topic><topic>Catalysts: preparations and properties</topic><topic>Catalytic reactions</topic><topic>CHEMICAL ANALYSIS</topic><topic>Chemistry</topic><topic>CHROMIUM</topic><topic>DATA</topic><topic>ELEMENTS</topic><topic>Exact sciences and technology</topic><topic>EXPERIMENTAL DATA</topic><topic>General and physical chemistry</topic><topic>General. Nomenclature, chemical documentation, computer chemistry</topic><topic>GLASS</topic><topic>INFORMATION</topic><topic>INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY</topic><topic>ION MICROPROBE ANALYSIS</topic><topic>IRON</topic><topic>MASS SPECTROMETERS</topic><topic>MASS SPECTROSCOPY</topic><topic>MEASURING INSTRUMENTS</topic><topic>METALS</topic><topic>MICROANALYSIS</topic><topic>NICKEL</topic><topic>NIOBIUM</topic><topic>NONDESTRUCTIVE ANALYSIS</topic><topic>NUMERICAL DATA</topic><topic>QUANTITATIVE CHEMICAL ANALYSIS</topic><topic>SEMIMETALS</topic><topic>SENSITIVITY</topic><topic>SPECTROMETERS</topic><topic>SPECTROSCOPY</topic><topic>TANTALUM</topic><topic>Theory of reactions, general kinetics</topic><topic>Theory of reactions, general kinetics. Catalysis. Nomenclature, chemical documentation, computer chemistry</topic><topic>TRANSITION ELEMENTS</topic><topic>TUNGSTEN</topic><topic>VANADIUM</topic><topic>ZIRCONIUM</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Ruedenauer, Friedrich</creatorcontrib><creatorcontrib>Steiger, Wolfgang</creatorcontrib><creatorcontrib>Riedel, Miklos</creatorcontrib><creatorcontrib>Beske, Horst E</creatorcontrib><creatorcontrib>Holzbrecher, Horst</creatorcontrib><creatorcontrib>Gericke, Michael</creatorcontrib><creatorcontrib>Richter, Carl Ernst</creatorcontrib><creatorcontrib>Rieth, Michael</creatorcontrib><creatorcontrib>Trapp, Manfred</creatorcontrib><creatorcontrib>et al, .</creatorcontrib><creatorcontrib>Austrian Research Center Seibersdorf, Vienna</creatorcontrib><collection>Istex</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>OSTI.GOV</collection><jtitle>Anal. Chem.; (United States)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Ruedenauer, Friedrich</au><au>Steiger, Wolfgang</au><au>Riedel, Miklos</au><au>Beske, Horst E</au><au>Holzbrecher, Horst</au><au>Gericke, Michael</au><au>Richter, Carl Ernst</au><au>Rieth, Michael</au><au>Trapp, Manfred</au><au>et al, .</au><aucorp>Austrian Research Center Seibersdorf, Vienna</aucorp><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Cross calibration of secondary ion mass spectrometers</atitle><jtitle>Anal. Chem.; (United States)</jtitle><addtitle>Anal. Chem</addtitle><date>1985-07-01</date><risdate>1985</risdate><volume>57</volume><issue>8</issue><spage>1636</spage><epage>1643</epage><pages>1636-1643</pages><issn>0003-2700</issn><eissn>1520-6882</eissn><coden>ANCHAM</coden><abstract>It is known from previous round-robin experiments that relative sensitivity factors, obtained on identical samples by different SIMS instruments, frequently disagree by a factor of up to 50. A method is suggested for cross-calibrating instruments in such a way that relative elemental sensitivity factors determined on one SIMS instrument may be used on another instrument for quantification of unknown samples. The method consists in actively tuning the operating parameters of instruments in such a way that relative sensitivity factors for B and W (with respect to Fe) in a homogeneous B/sub 15/Fe/sub 75/W/sub 10/ metallic glass sample (primary calibration standard, PCS) are in close agreement on all participating instruments. In an experimental in which this cross-calibration strategy has been adopted, relative sensitivity factors of seven further elements, determined on seven different SIMS instruments (including ion microscopes, ion microprobes, and quadrupole-SIMS), agree within a factor of the order of 1.7. Improvements may be expected with better tuning to the PCS. 11 references, 3 figures, 8 tables.</abstract><cop>Washington, DC</cop><pub>American Chemical Society</pub><doi>10.1021/ac00285a030</doi><tpages>8</tpages></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0003-2700 |
| ispartof | Anal. Chem.; (United States), 1985-07, Vol.57 (8), p.1636-1643 |
| issn | 0003-2700 1520-6882 |
| language | eng |
| recordid | cdi_crossref_primary_10_1021_ac00285a030 |
| source | ACS Publications |
| subjects | 400104 - Spectral Procedures- (-1987) BORON CALIBRATION CALIBRATION STANDARDS Catalysis Catalysts: preparations and properties Catalytic reactions CHEMICAL ANALYSIS Chemistry CHROMIUM DATA ELEMENTS Exact sciences and technology EXPERIMENTAL DATA General and physical chemistry General. Nomenclature, chemical documentation, computer chemistry GLASS INFORMATION INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY ION MICROPROBE ANALYSIS IRON MASS SPECTROMETERS MASS SPECTROSCOPY MEASURING INSTRUMENTS METALS MICROANALYSIS NICKEL NIOBIUM NONDESTRUCTIVE ANALYSIS NUMERICAL DATA QUANTITATIVE CHEMICAL ANALYSIS SEMIMETALS SENSITIVITY SPECTROMETERS SPECTROSCOPY TANTALUM Theory of reactions, general kinetics Theory of reactions, general kinetics. Catalysis. Nomenclature, chemical documentation, computer chemistry TRANSITION ELEMENTS TUNGSTEN VANADIUM ZIRCONIUM |
| title | Cross calibration of secondary ion mass spectrometers |
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