Ion microprobe mass spectrometry using sputtering atomization and resonance ionization
Resonance ionization mass spectrometry (RIMS) has been applied to the measurement of U and Sm by utilizing ion beam sputtering atomization. The goal is to produce an ultrasensitive analytical technique for measuring elements of environmental concern in small particles or inclusions. An ion microprob...
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| Veröffentlicht in: | Anal. Chem.; (United States) 1985-06, Vol.57 (7), p.1193-1197 |
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| container_title | Anal. Chem.; (United States) |
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| creator | Donohue, David L Christie, W. H Goeringe, D. E McKown, H. S |
| description | Resonance ionization mass spectrometry (RIMS) has been applied to the measurement of U and Sm by utilizing ion beam sputtering atomization. The goal is to produce an ultrasensitive analytical technique for measuring elements of environmental concern in small particles or inclusions. An ion microprobe mass analyzer (IMMA) has been modified to allow production of a sputtered atom plume through which high-powered tunable laser radiation is directed. Ions of a given element are produced by a multistep resonance ionization process followed by extraction into a double-focusing mass spectrometer for detection. Data are presented showing mass and optical spectra obtained as well as the sensitivity of the technique. 22 reference, 9 figures, 1 table. |
| doi_str_mv | 10.1021/ac00284a007 |
| format | Article |
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H</creatorcontrib><creatorcontrib>Goeringe, D. E</creatorcontrib><creatorcontrib>McKown, H. S</creatorcontrib><creatorcontrib>Oak Ridge National Lab., TN</creatorcontrib><title>Ion microprobe mass spectrometry using sputtering atomization and resonance ionization</title><title>Anal. Chem.; (United States)</title><addtitle>Anal. Chem</addtitle><description>Resonance ionization mass spectrometry (RIMS) has been applied to the measurement of U and Sm by utilizing ion beam sputtering atomization. The goal is to produce an ultrasensitive analytical technique for measuring elements of environmental concern in small particles or inclusions. An ion microprobe mass analyzer (IMMA) has been modified to allow production of a sputtered atom plume through which high-powered tunable laser radiation is directed. Ions of a given element are produced by a multistep resonance ionization process followed by extraction into a double-focusing mass spectrometer for detection. Data are presented showing mass and optical spectra obtained as well as the sensitivity of the technique. 22 reference, 9 figures, 1 table.</description><subject>400104 - Spectral Procedures- (-1987)</subject><subject>510200 - Environment, Terrestrial- Chemicals Monitoring & Transport- (-1989)</subject><subject>510300 - Environment, Terrestrial- Radioactive Materials Monitoring & Transport- (-1989)</subject><subject>520200 - Environment, Aquatic- Chemicals Monitoring & Transport- (-1989)</subject><subject>520300 - Environment, Aquatic- Radioactive Materials Monitoring & Transport-</subject><subject>ACTINIDES</subject><subject>Analytical chemistry</subject><subject>CHEMICAL ANALYSIS</subject><subject>Chemistry</subject><subject>DATA</subject><subject>ELEMENTS</subject><subject>ENVIRONMENTAL MATERIALS</subject><subject>ENVIRONMENTAL SCIENCES</subject><subject>Exact sciences and technology</subject><subject>EXPERIMENTAL DATA</subject><subject>INFORMATION</subject><subject>INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY</subject><subject>ION MICROPROBE ANALYSIS</subject><subject>MASS SPECTROSCOPY</subject><subject>MATERIALS</subject><subject>METALS</subject><subject>MICROANALYSIS</subject><subject>NONDESTRUCTIVE ANALYSIS</subject><subject>NUMERICAL DATA</subject><subject>QUANTITATIVE CHEMICAL ANALYSIS</subject><subject>RARE EARTHS</subject><subject>RESONANCE IONIZATION MASS SPECTROSCOPY</subject><subject>SAMARIUM</subject><subject>Spectrometric and optical methods</subject><subject>SPECTROSCOPY</subject><subject>SPUTTERING</subject><subject>URANIUM</subject><issn>0003-2700</issn><issn>1520-6882</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1985</creationdate><recordtype>article</recordtype><recordid>eNptkEtLxTAQhYMoeL268g8UEVxIdSa5bdqliC8UFXyBmzBNU43a5pLkgvrrjVTEhasZ5nwzzDmMbSLsIXDcJw3AqxkByCU2wYJDXlYVX2YTABA5lwCrbC2EFwBEwHLC7s_ckPVWezf3rjFZTyFkYW509K430X9ki2CHpzRaxGj8d0vR9faTok2bNLSZN8ENNGiTpcmPsM5WOnoLZuOnTtnd8dHt4Wl-cXVydnhwkZOoy5gLXsquEnKG2Da8pLITqGdNXTW6LRG5rnmNrRDJD2osOkKUDXWCdFUb3RZiyrbGuy5Eq4K20ehn7YYhGVAFCKikTNDuCCWXIXjTqbm3PfkPhaC-c1N_ckv09kjPKWh663yyZsPvSo2i4BITlo-YDdG8_8rkX1UphSzU7fWNggofzx_qS3WT-J2RJx3Ui1v4IeXy7wNflEuJQw</recordid><startdate>19850601</startdate><enddate>19850601</enddate><creator>Donohue, David L</creator><creator>Christie, W. H</creator><creator>Goeringe, D. E</creator><creator>McKown, H. S</creator><general>American Chemical Society</general><scope>BSCLL</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>OTOTI</scope></search><sort><creationdate>19850601</creationdate><title>Ion microprobe mass spectrometry using sputtering atomization and resonance ionization</title><author>Donohue, David L ; Christie, W. H ; Goeringe, D. E ; McKown, H. S</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-a396t-3267f837411db26a6f31c4b98bcd6112c9291d330071c15fa117baf3ac89ecd53</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1985</creationdate><topic>400104 - Spectral Procedures- (-1987)</topic><topic>510200 - Environment, Terrestrial- Chemicals Monitoring & Transport- (-1989)</topic><topic>510300 - Environment, Terrestrial- Radioactive Materials Monitoring & Transport- (-1989)</topic><topic>520200 - Environment, Aquatic- Chemicals Monitoring & Transport- (-1989)</topic><topic>520300 - Environment, Aquatic- Radioactive Materials Monitoring & Transport-</topic><topic>ACTINIDES</topic><topic>Analytical chemistry</topic><topic>CHEMICAL ANALYSIS</topic><topic>Chemistry</topic><topic>DATA</topic><topic>ELEMENTS</topic><topic>ENVIRONMENTAL MATERIALS</topic><topic>ENVIRONMENTAL SCIENCES</topic><topic>Exact sciences and technology</topic><topic>EXPERIMENTAL DATA</topic><topic>INFORMATION</topic><topic>INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY</topic><topic>ION MICROPROBE ANALYSIS</topic><topic>MASS SPECTROSCOPY</topic><topic>MATERIALS</topic><topic>METALS</topic><topic>MICROANALYSIS</topic><topic>NONDESTRUCTIVE ANALYSIS</topic><topic>NUMERICAL DATA</topic><topic>QUANTITATIVE CHEMICAL ANALYSIS</topic><topic>RARE EARTHS</topic><topic>RESONANCE IONIZATION MASS SPECTROSCOPY</topic><topic>SAMARIUM</topic><topic>Spectrometric and optical methods</topic><topic>SPECTROSCOPY</topic><topic>SPUTTERING</topic><topic>URANIUM</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Donohue, David L</creatorcontrib><creatorcontrib>Christie, W. H</creatorcontrib><creatorcontrib>Goeringe, D. E</creatorcontrib><creatorcontrib>McKown, H. S</creatorcontrib><creatorcontrib>Oak Ridge National Lab., TN</creatorcontrib><collection>Istex</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>OSTI.GOV</collection><jtitle>Anal. Chem.; (United States)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Donohue, David L</au><au>Christie, W. H</au><au>Goeringe, D. E</au><au>McKown, H. S</au><aucorp>Oak Ridge National Lab., TN</aucorp><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Ion microprobe mass spectrometry using sputtering atomization and resonance ionization</atitle><jtitle>Anal. Chem.; (United States)</jtitle><addtitle>Anal. Chem</addtitle><date>1985-06-01</date><risdate>1985</risdate><volume>57</volume><issue>7</issue><spage>1193</spage><epage>1197</epage><pages>1193-1197</pages><issn>0003-2700</issn><eissn>1520-6882</eissn><coden>ANCHAM</coden><abstract>Resonance ionization mass spectrometry (RIMS) has been applied to the measurement of U and Sm by utilizing ion beam sputtering atomization. The goal is to produce an ultrasensitive analytical technique for measuring elements of environmental concern in small particles or inclusions. An ion microprobe mass analyzer (IMMA) has been modified to allow production of a sputtered atom plume through which high-powered tunable laser radiation is directed. Ions of a given element are produced by a multistep resonance ionization process followed by extraction into a double-focusing mass spectrometer for detection. Data are presented showing mass and optical spectra obtained as well as the sensitivity of the technique. 22 reference, 9 figures, 1 table.</abstract><cop>Washington, DC</cop><pub>American Chemical Society</pub><doi>10.1021/ac00284a007</doi><tpages>5</tpages><oa>free_for_read</oa></addata></record> |
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| subjects | 400104 - Spectral Procedures- (-1987) 510200 - Environment, Terrestrial- Chemicals Monitoring & Transport- (-1989) 510300 - Environment, Terrestrial- Radioactive Materials Monitoring & Transport- (-1989) 520200 - Environment, Aquatic- Chemicals Monitoring & Transport- (-1989) 520300 - Environment, Aquatic- Radioactive Materials Monitoring & Transport- ACTINIDES Analytical chemistry CHEMICAL ANALYSIS Chemistry DATA ELEMENTS ENVIRONMENTAL MATERIALS ENVIRONMENTAL SCIENCES Exact sciences and technology EXPERIMENTAL DATA INFORMATION INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY ION MICROPROBE ANALYSIS MASS SPECTROSCOPY MATERIALS METALS MICROANALYSIS NONDESTRUCTIVE ANALYSIS NUMERICAL DATA QUANTITATIVE CHEMICAL ANALYSIS RARE EARTHS RESONANCE IONIZATION MASS SPECTROSCOPY SAMARIUM Spectrometric and optical methods SPECTROSCOPY SPUTTERING URANIUM |
| title | Ion microprobe mass spectrometry using sputtering atomization and resonance ionization |
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