Investigation of Phase Transformations in Ge 4 Sb 4 Te 5 film using Transmission Electron Microscopy

Investigation of Phase Transformations in Ge 4 Sb 4 Te 5 film using Transmission Electron Microscopy

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Veröffentlicht in:Microscopy and microanalysis 2021-08, Vol.27 (S1), p.1240-1242
Hauptverfasser: Singh, Manish, Ghosh, Chanchal, Kotula, Paul, Miller, Benjamin, Watt, John, Silva, Helena, Barry Carter, C.
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container_end_page 1242
container_issue S1
container_start_page 1240
container_title Microscopy and microanalysis
container_volume 27
creator Singh, Manish
Ghosh, Chanchal
Kotula, Paul
Miller, Benjamin
Watt, John
Silva, Helena
Barry Carter, C.
description
doi_str_mv 10.1017/S1431927621004657
format Article
fullrecord <record><control><sourceid>crossref</sourceid><recordid>TN_cdi_crossref_primary_10_1017_S1431927621004657</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1017_S1431927621004657</sourcerecordid><originalsourceid>FETCH-crossref_primary_10_1017_S14319276210046573</originalsourceid><addsrcrecordid>eNqdT8uKwkAQHGQXfKwf4K1_INptXnpefB0EIbmH2eyMjiQzMp0V_HsT9eZtL11FVXVBCTEhnBJSOssoCmk5T5M5IUZJnPbEoJXiYEEUfzw4BZ3fF0PmMyKGmCYD8buzV8WNOcrGOAtOw-EkWUHupWXtfP3QGYyFjYIIsp_25Api0Kaq4Y-NPT7DtWHuKlaVKhvfkr0pvePSXW5f4lPLitX4hSNB61X-vQ26AHuli4s3tfS3grDo5hRvc8L__NwB_xhRqw</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Investigation of Phase Transformations in Ge 4 Sb 4 Te 5 film using Transmission Electron Microscopy</title><source>Cambridge University Press Journals Complete</source><creator>Singh, Manish ; Ghosh, Chanchal ; Kotula, Paul ; Miller, Benjamin ; Watt, John ; Silva, Helena ; Barry Carter, C.</creator><creatorcontrib>Singh, Manish ; Ghosh, Chanchal ; Kotula, Paul ; Miller, Benjamin ; Watt, John ; Silva, Helena ; Barry Carter, C.</creatorcontrib><identifier>ISSN: 1431-9276</identifier><identifier>EISSN: 1435-8115</identifier><identifier>DOI: 10.1017/S1431927621004657</identifier><language>eng</language><ispartof>Microscopy and microanalysis, 2021-08, Vol.27 (S1), p.1240-1242</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-crossref_primary_10_1017_S14319276210046573</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>315,781,785,27929,27930</link.rule.ids></links><search><creatorcontrib>Singh, Manish</creatorcontrib><creatorcontrib>Ghosh, Chanchal</creatorcontrib><creatorcontrib>Kotula, Paul</creatorcontrib><creatorcontrib>Miller, Benjamin</creatorcontrib><creatorcontrib>Watt, John</creatorcontrib><creatorcontrib>Silva, Helena</creatorcontrib><creatorcontrib>Barry Carter, C.</creatorcontrib><title>Investigation of Phase Transformations in Ge 4 Sb 4 Te 5 film using Transmission Electron Microscopy</title><title>Microscopy and microanalysis</title><issn>1431-9276</issn><issn>1435-8115</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2021</creationdate><recordtype>article</recordtype><recordid>eNqdT8uKwkAQHGQXfKwf4K1_INptXnpefB0EIbmH2eyMjiQzMp0V_HsT9eZtL11FVXVBCTEhnBJSOssoCmk5T5M5IUZJnPbEoJXiYEEUfzw4BZ3fF0PmMyKGmCYD8buzV8WNOcrGOAtOw-EkWUHupWXtfP3QGYyFjYIIsp_25Api0Kaq4Y-NPT7DtWHuKlaVKhvfkr0pvePSXW5f4lPLitX4hSNB61X-vQ26AHuli4s3tfS3grDo5hRvc8L__NwB_xhRqw</recordid><startdate>202108</startdate><enddate>202108</enddate><creator>Singh, Manish</creator><creator>Ghosh, Chanchal</creator><creator>Kotula, Paul</creator><creator>Miller, Benjamin</creator><creator>Watt, John</creator><creator>Silva, Helena</creator><creator>Barry Carter, C.</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>202108</creationdate><title>Investigation of Phase Transformations in Ge 4 Sb 4 Te 5 film using Transmission Electron Microscopy</title><author>Singh, Manish ; Ghosh, Chanchal ; Kotula, Paul ; Miller, Benjamin ; Watt, John ; Silva, Helena ; Barry Carter, C.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-crossref_primary_10_1017_S14319276210046573</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2021</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Singh, Manish</creatorcontrib><creatorcontrib>Ghosh, Chanchal</creatorcontrib><creatorcontrib>Kotula, Paul</creatorcontrib><creatorcontrib>Miller, Benjamin</creatorcontrib><creatorcontrib>Watt, John</creatorcontrib><creatorcontrib>Silva, Helena</creatorcontrib><creatorcontrib>Barry Carter, C.</creatorcontrib><collection>CrossRef</collection><jtitle>Microscopy and microanalysis</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Singh, Manish</au><au>Ghosh, Chanchal</au><au>Kotula, Paul</au><au>Miller, Benjamin</au><au>Watt, John</au><au>Silva, Helena</au><au>Barry Carter, C.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Investigation of Phase Transformations in Ge 4 Sb 4 Te 5 film using Transmission Electron Microscopy</atitle><jtitle>Microscopy and microanalysis</jtitle><date>2021-08</date><risdate>2021</risdate><volume>27</volume><issue>S1</issue><spage>1240</spage><epage>1242</epage><pages>1240-1242</pages><issn>1431-9276</issn><eissn>1435-8115</eissn><doi>10.1017/S1431927621004657</doi></addata></record>
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1435-8115
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source Cambridge University Press Journals Complete
title Investigation of Phase Transformations in Ge 4 Sb 4 Te 5 film using Transmission Electron Microscopy
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-14T23%3A54%3A36IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Investigation%20of%20Phase%20Transformations%20in%20Ge%204%20Sb%204%20Te%205%20film%20using%20Transmission%20Electron%20Microscopy&rft.jtitle=Microscopy%20and%20microanalysis&rft.au=Singh,%20Manish&rft.date=2021-08&rft.volume=27&rft.issue=S1&rft.spage=1240&rft.epage=1242&rft.pages=1240-1242&rft.issn=1431-9276&rft.eissn=1435-8115&rft_id=info:doi/10.1017/S1431927621004657&rft_dat=%3Ccrossref%3E10_1017_S1431927621004657%3C/crossref%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true