Transient characteristics of the InGaP–GaAs–InGaAs–GaAs transistor laser
Transient characteristics of the InGaP–GaAs–InGaAs (quantum well)-GaAs transistor laser are studied. Rate equations are numerically solved to obtain the response of current density and photon density. Expression of resonance frequency is obtained by solving the rate equations analytically. It has be...
Gespeichert in:
Veröffentlicht in: | Optical and quantum electronics 2013-06, Vol.45 (6), p.543-547 |
---|---|
Hauptverfasser: | , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | Transient characteristics of the InGaP–GaAs–InGaAs (quantum well)-GaAs transistor laser are studied. Rate equations are numerically solved to obtain the response of current density and photon density. Expression of resonance frequency
is obtained by solving the rate equations analytically. It has been found that the
increases with decreasing spontaneous carrier lifetime and with increasing value of the bias current density. |
---|---|
ISSN: | 0306-8919 1572-817X |
DOI: | 10.1007/s11082-013-9680-6 |