Spectroscopic ellipsometry studies of excitonic features and optical functions of AlxGa1-xAs/GaAs multiple quantum well structures
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| Veröffentlicht in: | Journal of electronic materials 1990, Vol.19 (1), p.51-58 |
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| container_end_page | 58 |
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| container_issue | 1 |
| container_start_page | 51 |
| container_title | Journal of electronic materials |
| container_volume | 19 |
| creator | PICKERING, C SHAND, B. A SMITH, G. W |
| description | |
| doi_str_mv | 10.1007/BF02655551 |
| format | Article |
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| fulltext | fulltext |
| identifier | ISSN: 0361-5235 |
| ispartof | Journal of electronic materials, 1990, Vol.19 (1), p.51-58 |
| issn | 0361-5235 1543-186X |
| language | eng |
| recordid | cdi_crossref_primary_10_1007_BF02655551 |
| source | Springer Nature |
| subjects | Condensed matter: electronic structure, electrical, magnetic, and optical properties Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures Exact sciences and technology Physics Surface and interface electron states |
| title | Spectroscopic ellipsometry studies of excitonic features and optical functions of AlxGa1-xAs/GaAs multiple quantum well structures |
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