Some analytical investigations into the use of X-rays emitted during charged-particle irradiation

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Veröffentlicht in:	J. Radioanal. Chem., v. 16, no. 2, pp. 445-452 v. 16, no. 2, pp. 445-452, 1973-09, Vol.16 (2), p.445-452
Hauptverfasser:	Peisach, M., Newton, D. A., Peck, P. F., Pierce, T. B.
Format:	Artikel
Sprache:	eng
Schlagworte:	DISTRIBUTION- GERMANIUM- SILICON MEV RANGE 01-10 MICROANALYSIS N40110 -Chemistry-Analytical & Separations Chemistry- Activation & Nuclear Reaction Procedures PROTON REACTIONS QUANTITATIVE CHEMICAL ANALYSIS X RADIATION ALUMINIUM ALLOYS
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subjects	DISTRIBUTION- GERMANIUM- SILICON MEV RANGE 01-10 MICROANALYSIS N40110 -Chemistry-Analytical & Separations Chemistry- Activation & Nuclear Reaction Procedures PROTON REACTIONS QUANTITATIVE CHEMICAL ANALYSIS X RADIATION ALUMINIUM ALLOYS
title	Some analytical investigations into the use of X-rays emitted during charged-particle irradiation
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