Quantitative analysis of oxide films on ODS-alloys using MCs+-SIMS and e-beam SNMS

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Veröffentlicht in:	Fresenius' Journal of Analytical Chemistry 1993-01, Vol.346 (1-3), p.186-191
Hauptverfasser:	PFEIFER, J.-P, HOLZBRECHER, H, QUADAKKERS, W. J, BREUER, U, SPEIER, W
Format:	Artikel
Sprache:	eng
Schlagworte:	Analytical chemistry Applied sciences Chemistry Exact sciences and technology Metals. Metallurgy Spectrometric and optical methods
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source	SpringerLink Journals - AutoHoldings
subjects	Analytical chemistry Applied sciences Chemistry Exact sciences and technology Metals. Metallurgy Spectrometric and optical methods
title	Quantitative analysis of oxide films on ODS-alloys using MCs+-SIMS and e-beam SNMS
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