SIMS/XPS Investigations on Activated Carbon Catalyst Supports

The surface modifications of activated carbon catalyst supports due to HCl treatment were measured in investigations combining X-ray photoelectron spectroscopy (XPS) and secondary ion mass spectrometry (SIMS). The surface properties of carbons derived from beech wood, pine wood, and bitumen were qua...

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Veröffentlicht in:	Journal of Catalysis 1994-12, Vol.150 (2), p.368-375
Hauptverfasser:	Albers, P., Deller, K., Despeyroux, B.M., Prescher, G., Schafer, A., Seibold, K.
Format:	Artikel
Sprache:	eng
Schlagworte:	40 CHEMISTRY ACTIVATED CARBON AROMATICS CATALYST SUPPORTS CATALYSTS ION MICROPROBE ANALYSIS MASS SPECTROSCOPY PHOTOELECTRON SPECTROSCOPY STRUCTURAL CHEMICAL ANALYSIS X-RAY SPECTROSCOPY
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