Rate coefficient and collision frequency for electron collision process in hot SF 6 gas under electric field: electrical breakdown property at 300–3000 K

Hot SF 6 gas of several thousand kelvins is produced during the current interruption process in a gas circuit breaker. If the hot gas is subjected to an electric field, electrical breakdown of the hot gas can occur as a consequence of the ionization and attachment processes by electron impact. The p...

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Veröffentlicht in:IEEJ transactions on electrical and electronic engineering 2019-04, Vol.14 (4), p.506-519
Hauptverfasser: Yokomizu, Yasunobu, Murakita, Keisuke, Kojima, Yuki, Matsumura, Toshiro, Sato, Motohiro, Horinouchi, Katsuhiko
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Sprache:eng
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Zusammenfassung:Hot SF 6 gas of several thousand kelvins is produced during the current interruption process in a gas circuit breaker. If the hot gas is subjected to an electric field, electrical breakdown of the hot gas can occur as a consequence of the ionization and attachment processes by electron impact. The probability of occurrence of the process is stated in terms of a rate coefficient. First, this paper describes the rate coefficients of the electron impact processes in the hot SF 6 gas subjected to an electric field. The rate coefficients in SF 6 gas in the range 300–3000 K at 0.6 MPa are evaluated for 21 processes such as SF 4  + e → SF 4 +  + 2e and F 2  + e → (F 2 − ) *  → F −  + F. Second, using these rate coefficients we obtain the collision frequencies of the 21 processes and find out the predominant processes in the hot SF 6 gas. Finally, 26 continuity equations with the rate coefficients are expressed in terms of the particle number densities. Using numerical solutions of the continuity equations, we derive the critical electric field of SF 6 gas for different temperatures. Furthermore, comparative discussions are presented on the critical electric field strength and the collision cross‐sections shown in other published papers. The present study is considered to provide the rate coefficients and the critical electric field strengths with higher accuracy. © 2018 Institute of Electrical Engineers of Japan. Published by John Wiley & Sons, Inc.
ISSN:1931-4973
1931-4981
DOI:10.1002/tee.22834