Imaging microanalysis of ceramic materials with a scanning ion microprobe

This article discusses the application of a scanning ion microprobe coupled with secondary ion mass spectrometry (SIMS) in the microanalytical characterization of ceramic materials. The high spatial resolution afforded by the microprobe mode, in conjunction with the analytical sensitivity of SIMS, m...

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Veröffentlicht in:	Surface and interface analysis 1994-02, Vol.21 (2), p.117-122
Hauptverfasser:	Soni, K. K., Chabala, J. M., Mogilevsky, R., Levi-Setti, R., Zhang, K., Wolbach, W. S., Bryan, S. R.
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: structure, mechanical and thermal properties Equations of state, phase equilibria, and phase transitions Exact sciences and technology Other topics in equations of state, phase equilibria, and phase transitions Physics
Online-Zugang:	Volltext
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