Surface science insight note: A linear algebraic approach to elucidate native films on Fe 3 O 4 surface

Standard materials are often used to obtain spectra that can be compared to those from unknown samples. Spectra measured from these known substances are also used as a means of computing sensitivity factors to allow quantification by X‐ray photoelectron spectroscopy (XPS) of less well‐defined materi...

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Veröffentlicht in:	Surface and interface analysis 2024-04, Vol.56 (4), p.189-199
Hauptverfasser:	Bargiela, Pascal, Fernandez, Vincent, Morgan, David, Fairley, Neal, Baltrusaitis, Jonas
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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