Atomic force microscopy investigation of cold-plasma-treated poly(ethyleneterephthalate) textiles

Atomic force microscopy (AFM) has been applied to investigate the morphological and topographical surface modifications induced by radiofrequency cold plasma processing of poly(ethyleneterephthalate) textiles. Surface effects are analysed in low‐pressure air plasma for different plasma exposure time...

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Veröffentlicht in:Surface and interface analysis 2003-04, Vol.35 (4), p.410-412
Hauptverfasser: Poletti, G., Orsini, F., Riccardi, C., Raffaele-Addamo, A., Barni, R.
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container_issue 4
container_start_page 410
container_title Surface and interface analysis
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creator Poletti, G.
Orsini, F.
Riccardi, C.
Raffaele-Addamo, A.
Barni, R.
description Atomic force microscopy (AFM) has been applied to investigate the morphological and topographical surface modifications induced by radiofrequency cold plasma processing of poly(ethyleneterephthalate) textiles. Surface effects are analysed in low‐pressure air plasma for different plasma exposure times. The results show a progressive degradation of the surface with increasing roughness. The analysis suggests that modification of the surface during textile treatment may be ascribed to a plasma‐induced physical process. Copyright © 2003 John Wiley & Sons, Ltd.
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subjects atomic force microscopy (AFM)
Condensed matter: structure, mechanical and thermal properties
Cross-disciplinary physics: materials science
rheology
Exact sciences and technology
Materials science
Physics
poly(ethyleneterephthalate) (PET)
Polymers, organic compounds
Radiation effects on specific materials
Solid surfaces and solid-solid interfaces
Structure of solids and liquids
crystallography
Surface structure and topography
Surface treatments
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
topographical surface modifications
title Atomic force microscopy investigation of cold-plasma-treated poly(ethyleneterephthalate) textiles
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