Microstructural and physicochemical study of the buried Fe/AlGaAs(100) interface by transmission electron microscopy and x-ray emission spectroscopy

Among the magnetic metal/semiconductor contacts, the Fe/GaAs system has been widely studied owing to its potential applications in electronic devices. In contrast, there are not many studies concerning the Fe/AlxGa1−xAs contact, and in particular there are no reports concerning the changes induced i...

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Veröffentlicht in:	Surface and interface analysis 2003-03, Vol.35 (3), p.246-250
Hauptverfasser:	Monteverde, F., Jonnard, P., Harel, S., Michel, A., Eymery, J. P.
Format:	Artikel
Sprache:	eng
Schlagworte:	aluminium-gallium arsenide Condensed matter: structure, mechanical and thermal properties Defects and impurities in crystals microstructure Exact sciences and technology interface Interface structure and roughness ion beam sputtering iron Physics Point defects (vacancies, interstitials, color centers, etc.) and defect clusters Solid surfaces and solid-solid interfaces Structure of solids and liquids crystallography Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) transmission electron microscopy x-ray emission
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