P-150: An Analysis Method of Image Sticking of LCD

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Veröffentlicht in:SID International Symposium Digest of technical papers 2016-05, Vol.47 (1), p.1693-1696
Hauptverfasser: Shin, Yonghwan, Jung, Minsik, Jeon, Baekkyun, Shin, Kichul, Roh, Namseok
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container_title SID International Symposium Digest of technical papers
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creator Shin, Yonghwan
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Jeon, Baekkyun
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doi_str_mv 10.1002/sdtp.11021
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2168-0159
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subjects Image sticking
LCD
VA mode
title P-150: An Analysis Method of Image Sticking of LCD
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