P-150: An Analysis Method of Image Sticking of LCD
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Veröffentlicht in: | SID International Symposium Digest of technical papers 2016-05, Vol.47 (1), p.1693-1696 |
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container_title | SID International Symposium Digest of technical papers |
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creator | Shin, Yonghwan Jung, Minsik Jeon, Baekkyun Shin, Kichul Roh, Namseok |
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doi_str_mv | 10.1002/sdtp.11021 |
format | Article |
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ispartof | SID International Symposium Digest of technical papers, 2016-05, Vol.47 (1), p.1693-1696 |
issn | 0097-966X 2168-0159 |
language | eng |
recordid | cdi_crossref_primary_10_1002_sdtp_11021 |
source | Access via Wiley Online Library |
subjects | Image sticking LCD VA mode |
title | P-150: An Analysis Method of Image Sticking of LCD |
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