Thin films for SEM specimen coatings: The backscattered electron contribution

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Veröffentlicht in:Scanning 1980, Vol.3 (3), p.210-214
1. Verfasser: Sogard, M. R.
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container_end_page 214
container_issue 3
container_start_page 210
container_title Scanning
container_volume 3
creator Sogard, M. R.
description
doi_str_mv 10.1002/sca.4950030313
format Article
fullrecord <record><control><sourceid>istex_cross</sourceid><recordid>TN_cdi_crossref_primary_10_1002_sca_4950030313</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>ark_67375_WNG_N58F5P3L_D</sourcerecordid><originalsourceid>FETCH-LOGICAL-c3633-7b9b7498452f614c2b9e8e8993c1564083f9a832f541b2668da8ac7add40eb893</originalsourceid><addsrcrecordid>eNqF0M1OAjEUBeDGaCKiW9d9gcF2-u-OIKAJoAkYl03b6UhlmCHtGOXtHYLRuHJ1N-e79-YAcI3RACOU3yRnBlQxhAgimJyAHlYkz6Sg7BT0EOY4Q5SJc3CR0hvqgJK4B-ardahhGaptgmUT4XI8h2nnXdj6GrrGtKF-TbdwtfbQGrfpbrStj76AvvKujc0hVLcx2Pc2NPUlOCtNlfzV9-yD58l4NbrPZo_Th9FwljnCCcmEVVZQJSnLS46py63y0kuliMOMUyRJqYwkeckotjnnsjDSOGGKgiJvpSJ9MDjudbFJKfpS72LYmrjXGOlDGbp7VP-W0QF1BB-h8vt_0no5Gv6x2dGG1PrPH2viRnNBBNMvi6leMDlhT2Sm78gX-cZxxA</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Thin films for SEM specimen coatings: The backscattered electron contribution</title><source>Elektronische Zeitschriftenbibliothek - Frei zugängliche E-Journals</source><creator>Sogard, M. R.</creator><creatorcontrib>Sogard, M. R.</creatorcontrib><identifier>ISSN: 0161-0457</identifier><identifier>EISSN: 1932-8745</identifier><identifier>DOI: 10.1002/sca.4950030313</identifier><language>eng</language><publisher>New Jersey: Wiley Periodicals, Inc</publisher><ispartof>Scanning, 1980, Vol.3 (3), p.210-214</ispartof><rights>Copyright © 1980 Foundation for Advances in Medicine and Science, Inc.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c3633-7b9b7498452f614c2b9e8e8993c1564083f9a832f541b2668da8ac7add40eb893</citedby><cites>FETCH-LOGICAL-c3633-7b9b7498452f614c2b9e8e8993c1564083f9a832f541b2668da8ac7add40eb893</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,777,781,4010,27904,27905,27906</link.rule.ids></links><search><creatorcontrib>Sogard, M. R.</creatorcontrib><title>Thin films for SEM specimen coatings: The backscattered electron contribution</title><title>Scanning</title><addtitle>Scanning</addtitle><issn>0161-0457</issn><issn>1932-8745</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1980</creationdate><recordtype>article</recordtype><recordid>eNqF0M1OAjEUBeDGaCKiW9d9gcF2-u-OIKAJoAkYl03b6UhlmCHtGOXtHYLRuHJ1N-e79-YAcI3RACOU3yRnBlQxhAgimJyAHlYkz6Sg7BT0EOY4Q5SJc3CR0hvqgJK4B-ardahhGaptgmUT4XI8h2nnXdj6GrrGtKF-TbdwtfbQGrfpbrStj76AvvKujc0hVLcx2Pc2NPUlOCtNlfzV9-yD58l4NbrPZo_Th9FwljnCCcmEVVZQJSnLS46py63y0kuliMOMUyRJqYwkeckotjnnsjDSOGGKgiJvpSJ9MDjudbFJKfpS72LYmrjXGOlDGbp7VP-W0QF1BB-h8vt_0no5Gv6x2dGG1PrPH2viRnNBBNMvi6leMDlhT2Sm78gX-cZxxA</recordid><startdate>1980</startdate><enddate>1980</enddate><creator>Sogard, M. R.</creator><general>Wiley Periodicals, Inc</general><scope>BSCLL</scope><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>1980</creationdate><title>Thin films for SEM specimen coatings: The backscattered electron contribution</title><author>Sogard, M. R.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c3633-7b9b7498452f614c2b9e8e8993c1564083f9a832f541b2668da8ac7add40eb893</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1980</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Sogard, M. R.</creatorcontrib><collection>Istex</collection><collection>CrossRef</collection><jtitle>Scanning</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Sogard, M. R.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Thin films for SEM specimen coatings: The backscattered electron contribution</atitle><jtitle>Scanning</jtitle><addtitle>Scanning</addtitle><date>1980</date><risdate>1980</risdate><volume>3</volume><issue>3</issue><spage>210</spage><epage>214</epage><pages>210-214</pages><issn>0161-0457</issn><eissn>1932-8745</eissn><cop>New Jersey</cop><pub>Wiley Periodicals, Inc</pub><doi>10.1002/sca.4950030313</doi><tpages>5</tpages></addata></record>
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1932-8745
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recordid cdi_crossref_primary_10_1002_sca_4950030313
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title Thin films for SEM specimen coatings: The backscattered electron contribution
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-19T06%3A31%3A47IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-istex_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Thin%20films%20for%20SEM%20specimen%20coatings:%20The%20backscattered%20electron%20contribution&rft.jtitle=Scanning&rft.au=Sogard,%20M.%20R.&rft.date=1980&rft.volume=3&rft.issue=3&rft.spage=210&rft.epage=214&rft.pages=210-214&rft.issn=0161-0457&rft.eissn=1932-8745&rft_id=info:doi/10.1002/sca.4950030313&rft_dat=%3Cistex_cross%3Eark_67375_WNG_N58F5P3L_D%3C/istex_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true