Dielectric and magnetic birefringence in low‐chlorine‐doped n ‐type Zn 1– x Mn x Se
Generalized spectroscopic ellipsometry over the spectral range from 1.24 to 3.34 eV is used to investigate a set of molecular beam epitaxy grown lowchlorine‐doped n ‐type Zn 1– x Mn x Se films on (001)‐oriented GaAs for x = 0.0, 0.02, 0.14 and 0.28. We present evidence for intrinsic optical anisotro...
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Veröffentlicht in: | Physica status solidi. C 2008-05, Vol.5 (5), p.1007-1011 |
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Hauptverfasser: | , , , , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | Generalized spectroscopic ellipsometry over the spectral range from 1.24 to 3.34 eV is used to investigate a set of molecular beam epitaxy grown lowchlorine‐doped
n
‐type Zn
1–
x
Mn
x
Se films on (001)‐oriented GaAs for
x
= 0.0, 0.02, 0.14 and 0.28. We present evidence for intrinsic optical anisotropy in dependence of the Mn concentration caused by wurtzitestructure domain formation. We employ a previously established dielectric function model that accounts for band‐gap transition energy splitting in cubic semiconductors [Phys. Rev. B
60
, 16618 (1999)]. Room temperature magneto‐optic generalized ellipsometry in the Kerrconfiguration reveals the
sp‐d
exchange energy splitting parameters upon expanding our anisotropy model by inclusion of chiral spin‐polarized band‐to‐band transition contributions. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim) |
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ISSN: | 1862-6351 1610-1642 |
DOI: | 10.1002/pssc.200777907 |