Correlation between the Porous Silicon Morphology and the Photoluminescence Efficiency

Small‐angle X‐ray scattering is applied to investigate the microstructure and the morphology of three photoluminescent porous silicon samples of the same porosity (80%) but prepared using different electrochemical treatments: (A) as‐prepared, (B) as‐prepared 65% porosity, followed by an oxidation tr...

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Veröffentlicht in:	Physica status solidi. B. Basic research 1995-07, Vol.190 (1), p.63-68
Hauptverfasser:	Goudeau, P., Naudon, A., Vezin, V., Halimaoui, A., Bomchil, G., Lambert, B.
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: electronic structure, electrical, magnetic, and optical properties Cross-disciplinary physics: materials science rheology Exact sciences and technology Materials science Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation Other solid inorganic materials Photoluminescence Physics Surface treatments
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