Scanning Tunneling Microscope‐Characterization of Chemical Vapor Deposition‐Graphene: Ripples and Twisted Bi‐layers at Multiple Scales

Despite numerous limitations, graphene characterization using scanning tunneling microscopy is an important aspect of graphene research. In the present study, an ambient, large effective field of view scanning tunneling microscope (A‐LEF‐STM) is used as a more practical extension of a standard STM f...

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Veröffentlicht in:	physica status solidi (b) 2025-02, Vol.262 (2), p.n/a
Hauptverfasser:	Tyagi, Mahima, Tiwari, Aman Abhishek, Mathew, Joshua, Sahdev, Deshdeep, Dey, Srijata, Chandran, Maneesh
Format:	Artikel
Sprache:	eng
Schlagworte:	chemical vapor deposition graphene moire pattern ripples scanning tunneling microscscopy
Online-Zugang:	Volltext
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