Defects in silicon crystals after the high temperature treatment

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Physica status solidi. A, Applied research Applied research, 1982-04, Vol.70 (2), p.763-768
Hauptverfasser: Groza, A. A., Nikolaeva, L. G., Starchik, M. I., Shmatko, G. G., Zaslavskii, Yu. I.
Format: Artikel
Sprache:ger
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 768
container_issue 2
container_start_page 763
container_title Physica status solidi. A, Applied research
container_volume 70
creator Groza, A. A.
Nikolaeva, L. G.
Starchik, M. I.
Shmatko, G. G.
Zaslavskii, Yu. I.
description
doi_str_mv 10.1002/pssa.2210700247
format Article
fullrecord <record><control><sourceid>crossref</sourceid><recordid>TN_cdi_crossref_primary_10_1002_pssa_2210700247</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1002_pssa_2210700247</sourcerecordid><originalsourceid>FETCH-crossref_primary_10_1002_pssa_22107002473</originalsourceid><addsrcrecordid>eNqVjrsKwkAQRRdRMD5q2_2BmNlEo-kEH_gBFnbLEiZmJYlhZizy9yYgWFtdLpwDR6mVgbUBiKOW2a3j2MCuf5vdSAVmG5swydL7WAUAiQn3WbqdqhnzEwA2PRiowwkLzIW1bzT7yuevRufUsbiKtSsESUuJuvSPUgvWLZKTN6EWQic1NrJQk6JncfnduYou59vxGub0YiYsbEu-dtRZA3YItUOo_YUm_xsfQPJHNw</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Defects in silicon crystals after the high temperature treatment</title><source>Wiley Online Library All Journals</source><creator>Groza, A. A. ; Nikolaeva, L. G. ; Starchik, M. I. ; Shmatko, G. G. ; Zaslavskii, Yu. I.</creator><creatorcontrib>Groza, A. A. ; Nikolaeva, L. G. ; Starchik, M. I. ; Shmatko, G. G. ; Zaslavskii, Yu. I.</creatorcontrib><identifier>ISSN: 0031-8965</identifier><identifier>EISSN: 1521-396X</identifier><identifier>DOI: 10.1002/pssa.2210700247</identifier><language>ger</language><ispartof>Physica status solidi. A, Applied research, 1982-04, Vol.70 (2), p.763-768</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-crossref_primary_10_1002_pssa_22107002473</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27923,27924</link.rule.ids></links><search><creatorcontrib>Groza, A. A.</creatorcontrib><creatorcontrib>Nikolaeva, L. G.</creatorcontrib><creatorcontrib>Starchik, M. I.</creatorcontrib><creatorcontrib>Shmatko, G. G.</creatorcontrib><creatorcontrib>Zaslavskii, Yu. I.</creatorcontrib><title>Defects in silicon crystals after the high temperature treatment</title><title>Physica status solidi. A, Applied research</title><issn>0031-8965</issn><issn>1521-396X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1982</creationdate><recordtype>article</recordtype><recordid>eNqVjrsKwkAQRRdRMD5q2_2BmNlEo-kEH_gBFnbLEiZmJYlhZizy9yYgWFtdLpwDR6mVgbUBiKOW2a3j2MCuf5vdSAVmG5swydL7WAUAiQn3WbqdqhnzEwA2PRiowwkLzIW1bzT7yuevRufUsbiKtSsESUuJuvSPUgvWLZKTN6EWQic1NrJQk6JncfnduYou59vxGub0YiYsbEu-dtRZA3YItUOo_YUm_xsfQPJHNw</recordid><startdate>19820416</startdate><enddate>19820416</enddate><creator>Groza, A. A.</creator><creator>Nikolaeva, L. G.</creator><creator>Starchik, M. I.</creator><creator>Shmatko, G. G.</creator><creator>Zaslavskii, Yu. I.</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>19820416</creationdate><title>Defects in silicon crystals after the high temperature treatment</title><author>Groza, A. A. ; Nikolaeva, L. G. ; Starchik, M. I. ; Shmatko, G. G. ; Zaslavskii, Yu. I.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-crossref_primary_10_1002_pssa_22107002473</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>ger</language><creationdate>1982</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Groza, A. A.</creatorcontrib><creatorcontrib>Nikolaeva, L. G.</creatorcontrib><creatorcontrib>Starchik, M. I.</creatorcontrib><creatorcontrib>Shmatko, G. G.</creatorcontrib><creatorcontrib>Zaslavskii, Yu. I.</creatorcontrib><collection>CrossRef</collection><jtitle>Physica status solidi. A, Applied research</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Groza, A. A.</au><au>Nikolaeva, L. G.</au><au>Starchik, M. I.</au><au>Shmatko, G. G.</au><au>Zaslavskii, Yu. I.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Defects in silicon crystals after the high temperature treatment</atitle><jtitle>Physica status solidi. A, Applied research</jtitle><date>1982-04-16</date><risdate>1982</risdate><volume>70</volume><issue>2</issue><spage>763</spage><epage>768</epage><pages>763-768</pages><issn>0031-8965</issn><eissn>1521-396X</eissn><doi>10.1002/pssa.2210700247</doi></addata></record>
fulltext fulltext
identifier ISSN: 0031-8965
ispartof Physica status solidi. A, Applied research, 1982-04, Vol.70 (2), p.763-768
issn 0031-8965
1521-396X
language ger
recordid cdi_crossref_primary_10_1002_pssa_2210700247
source Wiley Online Library All Journals
title Defects in silicon crystals after the high temperature treatment
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-13T01%3A16%3A54IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Defects%20in%20silicon%20crystals%20after%20the%20high%20temperature%20treatment&rft.jtitle=Physica%20status%20solidi.%20A,%20Applied%20research&rft.au=Groza,%20A.%20A.&rft.date=1982-04-16&rft.volume=70&rft.issue=2&rft.spage=763&rft.epage=768&rft.pages=763-768&rft.issn=0031-8965&rft.eissn=1521-396X&rft_id=info:doi/10.1002/pssa.2210700247&rft_dat=%3Ccrossref%3E10_1002_pssa_2210700247%3C/crossref%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true