Strain profile and polarization enhancement in Ba 0.5 Sr 0.5 TiO 3 thin films

The sensitivity of spontaneous polarization to epitaxial strain for both 10 and 50 nm thick Ba 0.5 Sr 0.5 TiO 3 (BSTO) ferroelectric thin films has been studied. Crystal truncation rod (CTR) profiles in the 00 L directions at different wavelengths, and grazing incidence diffraction (GID) in the 0 K...

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Veröffentlicht in:	Physica status solidi. A, Applications and materials science Applications and materials science, 2012-11, Vol.209 (11), p.2255-2259
Hauptverfasser:	Amir, F. Z., Donner, W., Aspelmeyer, M., Noheda, B., Xi, X. X., Moss, S. C.
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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