Synchrotron topographic studies of growth defects in the core of a SrLaGaO 4 single crystal

Samples cut out from different regions of SrLaGaO 4 (SLG) single crystal grown along [001]‐direction were studied with a number of X‐ray diffraction topographic methods exploring both conventional and synchrotron X‐ray sources. The synchrotron investigation included in particular white beam projecti...

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Veröffentlicht in:Physica status solidi. A, Applications and materials science Applications and materials science, 2009-08, Vol.206 (8), p.1816-1819
Hauptverfasser: Malinowska, Agnieszka, Lefeld‐Sosnowska, Maria, Wieteska, Krzysztof, Wierzchowski, Wojciech, Härtwig, Jürgen, Graeff, Walter
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Sprache:eng
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