A new free-space method for measurement of electromagnetic parameters of biaxial materials at microwave frequencies

A free‐space method for the measurement of biaxial material is proposed in this paper. Four complex transverse constitutive parameters are directly computed from the reflection and transmission coefficients of a planar sample in free space for the normally incident plane wave with two polarizations....

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Veröffentlicht in:Microwave and optical technology letters 2005-07, Vol.46 (1), p.72-78
Hauptverfasser: Yin, Hong-Cheng, Chao, Zeng-Ming, Xu, Yan-Ping
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Sprache:eng
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