Phonon anharmonicity of thermoelectric material HfTe 5 studied by Raman spectroscopy

The understanding of phonon–phonon anharmonic effect in HfTe 5 is essential not only for fundamental scientific interest but also for its potential thermoelectric applications. Here, rectangular ribbon‐shaped HfTe 5 single crystals have been grown. Raman spectroscopy is further utilized to investiga...

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Veröffentlicht in:Journal of Raman spectroscopy 2021-05, Vol.52 (5), p.988-994
Hauptverfasser: Xie, Qiyun, Xu, Lihuan, Hu, Chengxiang, Chen, Limin, Zheng, Jiajin, Wang, Wei, Yin, Handi, Cheng, Guofeng, Ai, Xiaoqian
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container_end_page 994
container_issue 5
container_start_page 988
container_title Journal of Raman spectroscopy
container_volume 52
creator Xie, Qiyun
Xu, Lihuan
Hu, Chengxiang
Chen, Limin
Zheng, Jiajin
Wang, Wei
Yin, Handi
Cheng, Guofeng
Ai, Xiaoqian
description The understanding of phonon–phonon anharmonic effect in HfTe 5 is essential not only for fundamental scientific interest but also for its potential thermoelectric applications. Here, rectangular ribbon‐shaped HfTe 5 single crystals have been grown. Raman spectroscopy is further utilized to investigate the phonon anharmonicity of HfTe 5 by quantifying the temperature dependence of the phonon mode softening and broadening. We focus on the temperature range from 80 up to 400 K since obvious surface oxidation occurs at higher temperatures. It is found that four phonon anharmonic effects are non‐negligible. The phonon lifetime is greatly reduced by the enhancement of phonon scattering, resulting in the low thermal conductivity in HfTe 5 single crystals.
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fullrecord <record><control><sourceid>crossref</sourceid><recordid>TN_cdi_crossref_primary_10_1002_jrs_6090</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1002_jrs_6090</sourcerecordid><originalsourceid>FETCH-LOGICAL-c720-59520e4f35487eae74029663b390a980aa69f2b322d2ff4e5bac8ff6e337354c3</originalsourceid><addsrcrecordid>eNotkEtLxDAUhYMoOI6CPyFLNx1vkyZpljKoIwwo0n25TW9oh75I6qL_3hZdHQ6cB3yMPaZwSAHE8yXEgwYLV2yXgjVJppS6ZjuQxiSQ5fqW3cV4AQBrdbpjxVczDuPAcWgw9OPQunZe-Oj53NDqqSM3h9bxHmcKLXb85Aviisf5p26p5tXCv7HHgcdpS47RjdNyz248dpEe_nXPirfX4nhKzp_vH8eXc-KMgERZJYAyL1WWG0IyGQirtaykBbQ5IGrrRSWFqIX3GakKXe69JinN2nFyz57-Zt36GwP5cgptj2EpUyg3GOUKo9xgyF81KlLV</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Phonon anharmonicity of thermoelectric material HfTe 5 studied by Raman spectroscopy</title><source>Wiley Online Library All Journals</source><creator>Xie, Qiyun ; Xu, Lihuan ; Hu, Chengxiang ; Chen, Limin ; Zheng, Jiajin ; Wang, Wei ; Yin, Handi ; Cheng, Guofeng ; Ai, Xiaoqian</creator><creatorcontrib>Xie, Qiyun ; Xu, Lihuan ; Hu, Chengxiang ; Chen, Limin ; Zheng, Jiajin ; Wang, Wei ; Yin, Handi ; Cheng, Guofeng ; Ai, Xiaoqian</creatorcontrib><description>The understanding of phonon–phonon anharmonic effect in HfTe 5 is essential not only for fundamental scientific interest but also for its potential thermoelectric applications. Here, rectangular ribbon‐shaped HfTe 5 single crystals have been grown. Raman spectroscopy is further utilized to investigate the phonon anharmonicity of HfTe 5 by quantifying the temperature dependence of the phonon mode softening and broadening. We focus on the temperature range from 80 up to 400 K since obvious surface oxidation occurs at higher temperatures. It is found that four phonon anharmonic effects are non‐negligible. The phonon lifetime is greatly reduced by the enhancement of phonon scattering, resulting in the low thermal conductivity in HfTe 5 single crystals.</description><identifier>ISSN: 0377-0486</identifier><identifier>EISSN: 1097-4555</identifier><identifier>DOI: 10.1002/jrs.6090</identifier><language>eng</language><ispartof>Journal of Raman spectroscopy, 2021-05, Vol.52 (5), p.988-994</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c720-59520e4f35487eae74029663b390a980aa69f2b322d2ff4e5bac8ff6e337354c3</citedby><cites>FETCH-LOGICAL-c720-59520e4f35487eae74029663b390a980aa69f2b322d2ff4e5bac8ff6e337354c3</cites><orcidid>0000-0002-7019-1709 ; 0000-0002-3572-8734</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27923,27924</link.rule.ids></links><search><creatorcontrib>Xie, Qiyun</creatorcontrib><creatorcontrib>Xu, Lihuan</creatorcontrib><creatorcontrib>Hu, Chengxiang</creatorcontrib><creatorcontrib>Chen, Limin</creatorcontrib><creatorcontrib>Zheng, Jiajin</creatorcontrib><creatorcontrib>Wang, Wei</creatorcontrib><creatorcontrib>Yin, Handi</creatorcontrib><creatorcontrib>Cheng, Guofeng</creatorcontrib><creatorcontrib>Ai, Xiaoqian</creatorcontrib><title>Phonon anharmonicity of thermoelectric material HfTe 5 studied by Raman spectroscopy</title><title>Journal of Raman spectroscopy</title><description>The understanding of phonon–phonon anharmonic effect in HfTe 5 is essential not only for fundamental scientific interest but also for its potential thermoelectric applications. Here, rectangular ribbon‐shaped HfTe 5 single crystals have been grown. Raman spectroscopy is further utilized to investigate the phonon anharmonicity of HfTe 5 by quantifying the temperature dependence of the phonon mode softening and broadening. We focus on the temperature range from 80 up to 400 K since obvious surface oxidation occurs at higher temperatures. It is found that four phonon anharmonic effects are non‐negligible. The phonon lifetime is greatly reduced by the enhancement of phonon scattering, resulting in the low thermal conductivity in HfTe 5 single crystals.</description><issn>0377-0486</issn><issn>1097-4555</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2021</creationdate><recordtype>article</recordtype><recordid>eNotkEtLxDAUhYMoOI6CPyFLNx1vkyZpljKoIwwo0n25TW9oh75I6qL_3hZdHQ6cB3yMPaZwSAHE8yXEgwYLV2yXgjVJppS6ZjuQxiSQ5fqW3cV4AQBrdbpjxVczDuPAcWgw9OPQunZe-Oj53NDqqSM3h9bxHmcKLXb85Aviisf5p26p5tXCv7HHgcdpS47RjdNyz248dpEe_nXPirfX4nhKzp_vH8eXc-KMgERZJYAyL1WWG0IyGQirtaykBbQ5IGrrRSWFqIX3GakKXe69JinN2nFyz57-Zt36GwP5cgptj2EpUyg3GOUKo9xgyF81KlLV</recordid><startdate>202105</startdate><enddate>202105</enddate><creator>Xie, Qiyun</creator><creator>Xu, Lihuan</creator><creator>Hu, Chengxiang</creator><creator>Chen, Limin</creator><creator>Zheng, Jiajin</creator><creator>Wang, Wei</creator><creator>Yin, Handi</creator><creator>Cheng, Guofeng</creator><creator>Ai, Xiaoqian</creator><scope>AAYXX</scope><scope>CITATION</scope><orcidid>https://orcid.org/0000-0002-7019-1709</orcidid><orcidid>https://orcid.org/0000-0002-3572-8734</orcidid></search><sort><creationdate>202105</creationdate><title>Phonon anharmonicity of thermoelectric material HfTe 5 studied by Raman spectroscopy</title><author>Xie, Qiyun ; Xu, Lihuan ; Hu, Chengxiang ; Chen, Limin ; Zheng, Jiajin ; Wang, Wei ; Yin, Handi ; Cheng, Guofeng ; Ai, Xiaoqian</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c720-59520e4f35487eae74029663b390a980aa69f2b322d2ff4e5bac8ff6e337354c3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2021</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Xie, Qiyun</creatorcontrib><creatorcontrib>Xu, Lihuan</creatorcontrib><creatorcontrib>Hu, Chengxiang</creatorcontrib><creatorcontrib>Chen, Limin</creatorcontrib><creatorcontrib>Zheng, Jiajin</creatorcontrib><creatorcontrib>Wang, Wei</creatorcontrib><creatorcontrib>Yin, Handi</creatorcontrib><creatorcontrib>Cheng, Guofeng</creatorcontrib><creatorcontrib>Ai, Xiaoqian</creatorcontrib><collection>CrossRef</collection><jtitle>Journal of Raman spectroscopy</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Xie, Qiyun</au><au>Xu, Lihuan</au><au>Hu, Chengxiang</au><au>Chen, Limin</au><au>Zheng, Jiajin</au><au>Wang, Wei</au><au>Yin, Handi</au><au>Cheng, Guofeng</au><au>Ai, Xiaoqian</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Phonon anharmonicity of thermoelectric material HfTe 5 studied by Raman spectroscopy</atitle><jtitle>Journal of Raman spectroscopy</jtitle><date>2021-05</date><risdate>2021</risdate><volume>52</volume><issue>5</issue><spage>988</spage><epage>994</epage><pages>988-994</pages><issn>0377-0486</issn><eissn>1097-4555</eissn><abstract>The understanding of phonon–phonon anharmonic effect in HfTe 5 is essential not only for fundamental scientific interest but also for its potential thermoelectric applications. Here, rectangular ribbon‐shaped HfTe 5 single crystals have been grown. Raman spectroscopy is further utilized to investigate the phonon anharmonicity of HfTe 5 by quantifying the temperature dependence of the phonon mode softening and broadening. We focus on the temperature range from 80 up to 400 K since obvious surface oxidation occurs at higher temperatures. It is found that four phonon anharmonic effects are non‐negligible. The phonon lifetime is greatly reduced by the enhancement of phonon scattering, resulting in the low thermal conductivity in HfTe 5 single crystals.</abstract><doi>10.1002/jrs.6090</doi><tpages>7</tpages><orcidid>https://orcid.org/0000-0002-7019-1709</orcidid><orcidid>https://orcid.org/0000-0002-3572-8734</orcidid></addata></record>
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url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-12T03%3A41%3A28IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Phonon%20anharmonicity%20of%20thermoelectric%20material%20HfTe%205%20studied%20by%20Raman%20spectroscopy&rft.jtitle=Journal%20of%20Raman%20spectroscopy&rft.au=Xie,%20Qiyun&rft.date=2021-05&rft.volume=52&rft.issue=5&rft.spage=988&rft.epage=994&rft.pages=988-994&rft.issn=0377-0486&rft.eissn=1097-4555&rft_id=info:doi/10.1002/jrs.6090&rft_dat=%3Ccrossref%3E10_1002_jrs_6090%3C/crossref%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true