Observation of Mobility Above 2000 cm 2 /V s in 2DEG at LaInO 3 /BaSnO 3 Interface by Electric‐Double‐Layer Gating

The LaInO 3 /BaSnO 3 heterostructure has recently emerged as a promising platform for realizing 2D electron gas (2DEG) with unique transport properties, including excellent field‐effect at room temperature. However, there is a limit to improving its mobility due to intrinsic defects including the th...

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Veröffentlicht in:Advanced electronic materials 2024-12
Hauptverfasser: Lee, Jaehyeok, Cho, Hyeongmin, Park, Jisung, Kim, Bongju, Schlom, Darrell G., Char, Kookrin
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container_title Advanced electronic materials
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creator Lee, Jaehyeok
Cho, Hyeongmin
Park, Jisung
Kim, Bongju
Schlom, Darrell G.
Char, Kookrin
description The LaInO 3 /BaSnO 3 heterostructure has recently emerged as a promising platform for realizing 2D electron gas (2DEG) with unique transport properties, including excellent field‐effect at room temperature. However, there is a limit to improving its mobility due to intrinsic defects including the threading dislocations occurring during film growth. In spite of such high density defects at present, as an effort to increase the mobility of the 2DEG, the 2D carrier density to 10 14  cm −2 by ionic‐liquid gating is increased and we found the resulting 2DEG mobility enhancement up to 2100 cm 2  V −1  s −1 at 10 K, which is consistent with the fact that 2‐dimensionality offers more effective screening for defects. This findings offer insights into the properties of 2DEG formed with perovskite oxide semiconductor BaSnO 3 as well as highlight its future potential for applications.
doi_str_mv 10.1002/aelm.202400811
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title Observation of Mobility Above 2000 cm 2 /V s in 2DEG at LaInO 3 /BaSnO 3 Interface by Electric‐Double‐Layer Gating
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