An improved experimental determination of external photoluminescence quantum efficiency
The external photoluminescence quantum yield of, for example, thin film semiconductors can be conveniently determined using the improved integrating‐sphere method (see Figure) presented here. Spectrally resolved detection allows the excitation source and the emission to be distinguished. The method...
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| Veröffentlicht in: | Advanced materials (Weinheim) 1997-03, Vol.9 (3), p.230-232 |
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| container_title | Advanced materials (Weinheim) |
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| creator | de Mello, John C. Wittmann, H. Felix Friend, Richard H. |
| description | The external photoluminescence quantum yield of, for example, thin film semiconductors can be conveniently determined using the improved integrating‐sphere method (see Figure) presented here. Spectrally resolved detection allows the excitation source and the emission to be distinguished. The method will be particularly useful for samples with small Stocks' shifts or low photoluminescence quantum yields or for highly scattering samples. Fig |
| doi_str_mv | 10.1002/adma.19970090308 |
| format | Article |
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| fulltext | fulltext |
| identifier | ISSN: 0935-9648 |
| ispartof | Advanced materials (Weinheim), 1997-03, Vol.9 (3), p.230-232 |
| issn | 0935-9648 1521-4095 |
| language | eng |
| recordid | cdi_crossref_primary_10_1002_adma_19970090308 |
| source | Wiley Online Library - AutoHoldings Journals |
| subjects | Exact sciences and technology Fundamental areas of phenomenology (including applications) Optics Physics Wave optics |
| title | An improved experimental determination of external photoluminescence quantum efficiency |
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