Accurate surface potential determination in Schottky diodes by the use of a correlated current and capacitance voltage measurements.Application to n-InP

Based on current voltage（I-Vg） and capacitance voltage（C-Vg） measurements,a reliable procedure is proposed to determine the effective surface potential Vd（Vg） in Schottky diodes.In the framework of thermionic emission,our analysis includes both the effect of the series resistance and the ideality fa...

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Veröffentlicht in:	半导体学报 2011, Vol.32 (10), p.39-43
1. Verfasser:	Ali Ahaitouf Abdelaziz Ahaitouf Jean Paul Salvestrini Hussein Srour
Format:	Artikel
Sprache:	chi
Schlagworte:	InP 热离子发射 电位测定 电压依赖性 电容电压 电流电压 肖特基二极管 表面电位
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