Structural study of poly (methyl methacrylate) Langmuir-Blodgett monolayers by atomic force microscopy
Direct imaging of ultrathin organic films on solid surfaces is important for a variety of reasons; in particular, the use of such films as ultrathin resists for nanometer scale fabrication and information recording requires the understanding of their microstructure.However, few studies have been car...
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| Veröffentlicht in: | 中国科学通报：英文版 1995 (2), p.145-149 |
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| container_title | 中国科学通报：英文版 |
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| creator | 杨晓敏 顾宁 鲁武 陆祖宏 韦钰 |
| description | Direct imaging of ultrathin organic films on solid surfaces is important for a variety of reasons; in particular, the use of such films as ultrathin resists for nanometer scale fabrication and information recording requires the understanding of their microstructure.However, few studies have been carried out because it is difficult to observe ultrathin organic |
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| fulltext | fulltext |
| identifier | ISSN: 2095-9273 |
| ispartof | 中国科学通报：英文版, 1995 (2), p.145-149 |
| issn | 2095-9273 |
| language | eng |
| recordid | cdi_chongqing_primary_3001223685 |
| source | Alma/SFX Local Collection |
| subjects | atomic force LaDgmuir-Blodgett LB methacrylate methyl microscopy poly |
| title | Structural study of poly (methyl methacrylate) Langmuir-Blodgett monolayers by atomic force microscopy |
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