High Quality A1N with a Thin Interlayer Grown on a Sapphire Substrate by Plasma-Assisted Molecular Beam Epitaxy

We report an AIN epi-layer grown on sapphire by plasma-assisted molecular beam epitaxy with a thin interlayer structure. The effects of growth mode on threading dislocations (TDs) and surface morphology are studied. Then an interlayer structure grown under a V/Ⅲ ratio of 1 is adopted to improve the...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Chinese physics letters 2010-06, Vol.27 (6), p.233-236
Hauptverfasser: Fan, Ren, Zhi-Biao, Hao, Chen, Zhang, Jian-Nan, Hu, Yi, Luo
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 236
container_issue 6
container_start_page 233
container_title Chinese physics letters
container_volume 27
creator Fan, Ren
Zhi-Biao, Hao
Chen, Zhang
Jian-Nan, Hu
Yi, Luo
description We report an AIN epi-layer grown on sapphire by plasma-assisted molecular beam epitaxy with a thin interlayer structure. The effects of growth mode on threading dislocations (TDs) and surface morphology are studied. Then an interlayer structure grown under a V/Ⅲ ratio of 1 is adopted to improve the AIN crystalline quality. By optimizing the thickness of the interlayer, the TD density and surface roughness can be reduced simultaneously.
doi_str_mv 10.1088/0256-307X/27/6/068101
format Article
fullrecord <record><control><sourceid>iop_chong</sourceid><recordid>TN_cdi_chongqing_backfile_33956774</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><cqvip_id>33956774</cqvip_id><sourcerecordid>10_1088_0256_307X_27_6_068101</sourcerecordid><originalsourceid>FETCH-LOGICAL-c273t-718463d06321c7277b1b0df08d646321f5b4a0693eb301d9ef182394a14d7d1e3</originalsourceid><addsrcrecordid>eNqFkN9LwzAQx4MoOKd_ghB8tjbXtEn3OMfcBvMXm-BbSNt0jXZtTTJm_3tXNvai4NPB3ed7d3wQugZyBySOfRJEzKOEv_sB95lPWAwETlAPeAgejUJyinpH5hxdWPtBCEAM0EP1VK8K_LqRpXYtHsIT3mpXYImXha7wrHLKlLJVBk9Mva1wXe1GC9k0hTYKLzaJdUY6hZMWv5TSrqU3tFZbpzL8WJcq3ZTS4Hsl13jcaCe_20t0lsvSqqtD7aO3h_FyNPXmz5PZaDj30oBT53GIQ0YzwmgAKQ84TyAhWU7ijIVdL4-SUBI2oCqhBLKByiEO6CCUEGY8A0X7KNrvTU1trVG5aIxeS9MKIKKzJjojojMiAi6Y2Fvb5W73OV03x8ifqGiyfIeT3_h_F24OnxV1tfrS1UokMv3MdakEpYOIcR7SH-cthrg</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>High Quality A1N with a Thin Interlayer Grown on a Sapphire Substrate by Plasma-Assisted Molecular Beam Epitaxy</title><source>IOP Publishing Journals</source><source>Institute of Physics (IOP) Journals - HEAL-Link</source><creator>Fan, Ren ; Zhi-Biao, Hao ; Chen, Zhang ; Jian-Nan, Hu ; Yi, Luo</creator><creatorcontrib>Fan, Ren ; Zhi-Biao, Hao ; Chen, Zhang ; Jian-Nan, Hu ; Yi, Luo</creatorcontrib><description>We report an AIN epi-layer grown on sapphire by plasma-assisted molecular beam epitaxy with a thin interlayer structure. The effects of growth mode on threading dislocations (TDs) and surface morphology are studied. Then an interlayer structure grown under a V/Ⅲ ratio of 1 is adopted to improve the AIN crystalline quality. By optimizing the thickness of the interlayer, the TD density and surface roughness can be reduced simultaneously.</description><identifier>ISSN: 0256-307X</identifier><identifier>EISSN: 1741-3540</identifier><identifier>DOI: 10.1088/0256-307X/27/6/068101</identifier><language>eng</language><publisher>IOP Publishing</publisher><subject>AIN ; 夹层结构 ; 等离子体辅助分子束外延 ; 蓝宝石衬底 ; 薄夹层 ; 表面粗糙度</subject><ispartof>Chinese physics letters, 2010-06, Vol.27 (6), p.233-236</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c273t-718463d06321c7277b1b0df08d646321f5b4a0693eb301d9ef182394a14d7d1e3</citedby><cites>FETCH-LOGICAL-c273t-718463d06321c7277b1b0df08d646321f5b4a0693eb301d9ef182394a14d7d1e3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Uhttp://image.cqvip.com/vip1000/qk/84212X/84212X.jpg</thumbnail><linktopdf>$$Uhttps://iopscience.iop.org/article/10.1088/0256-307X/27/6/068101/pdf$$EPDF$$P50$$Giop$$H</linktopdf><link.rule.ids>314,776,780,27901,27902,53805,53885</link.rule.ids></links><search><creatorcontrib>Fan, Ren</creatorcontrib><creatorcontrib>Zhi-Biao, Hao</creatorcontrib><creatorcontrib>Chen, Zhang</creatorcontrib><creatorcontrib>Jian-Nan, Hu</creatorcontrib><creatorcontrib>Yi, Luo</creatorcontrib><title>High Quality A1N with a Thin Interlayer Grown on a Sapphire Substrate by Plasma-Assisted Molecular Beam Epitaxy</title><title>Chinese physics letters</title><addtitle>Chinese Physics Letters</addtitle><description>We report an AIN epi-layer grown on sapphire by plasma-assisted molecular beam epitaxy with a thin interlayer structure. The effects of growth mode on threading dislocations (TDs) and surface morphology are studied. Then an interlayer structure grown under a V/Ⅲ ratio of 1 is adopted to improve the AIN crystalline quality. By optimizing the thickness of the interlayer, the TD density and surface roughness can be reduced simultaneously.</description><subject>AIN</subject><subject>夹层结构</subject><subject>等离子体辅助分子束外延</subject><subject>蓝宝石衬底</subject><subject>薄夹层</subject><subject>表面粗糙度</subject><issn>0256-307X</issn><issn>1741-3540</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2010</creationdate><recordtype>article</recordtype><recordid>eNqFkN9LwzAQx4MoOKd_ghB8tjbXtEn3OMfcBvMXm-BbSNt0jXZtTTJm_3tXNvai4NPB3ed7d3wQugZyBySOfRJEzKOEv_sB95lPWAwETlAPeAgejUJyinpH5hxdWPtBCEAM0EP1VK8K_LqRpXYtHsIT3mpXYImXha7wrHLKlLJVBk9Mva1wXe1GC9k0hTYKLzaJdUY6hZMWv5TSrqU3tFZbpzL8WJcq3ZTS4Hsl13jcaCe_20t0lsvSqqtD7aO3h_FyNPXmz5PZaDj30oBT53GIQ0YzwmgAKQ84TyAhWU7ijIVdL4-SUBI2oCqhBLKByiEO6CCUEGY8A0X7KNrvTU1trVG5aIxeS9MKIKKzJjojojMiAi6Y2Fvb5W73OV03x8ifqGiyfIeT3_h_F24OnxV1tfrS1UokMv3MdakEpYOIcR7SH-cthrg</recordid><startdate>20100601</startdate><enddate>20100601</enddate><creator>Fan, Ren</creator><creator>Zhi-Biao, Hao</creator><creator>Chen, Zhang</creator><creator>Jian-Nan, Hu</creator><creator>Yi, Luo</creator><general>IOP Publishing</general><scope>2RA</scope><scope>92L</scope><scope>CQIGP</scope><scope>~WA</scope><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20100601</creationdate><title>High Quality A1N with a Thin Interlayer Grown on a Sapphire Substrate by Plasma-Assisted Molecular Beam Epitaxy</title><author>Fan, Ren ; Zhi-Biao, Hao ; Chen, Zhang ; Jian-Nan, Hu ; Yi, Luo</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c273t-718463d06321c7277b1b0df08d646321f5b4a0693eb301d9ef182394a14d7d1e3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2010</creationdate><topic>AIN</topic><topic>夹层结构</topic><topic>等离子体辅助分子束外延</topic><topic>蓝宝石衬底</topic><topic>薄夹层</topic><topic>表面粗糙度</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Fan, Ren</creatorcontrib><creatorcontrib>Zhi-Biao, Hao</creatorcontrib><creatorcontrib>Chen, Zhang</creatorcontrib><creatorcontrib>Jian-Nan, Hu</creatorcontrib><creatorcontrib>Yi, Luo</creatorcontrib><collection>中文科技期刊数据库</collection><collection>中文科技期刊数据库-CALIS站点</collection><collection>中文科技期刊数据库-7.0平台</collection><collection>中文科技期刊数据库- 镜像站点</collection><collection>CrossRef</collection><jtitle>Chinese physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Fan, Ren</au><au>Zhi-Biao, Hao</au><au>Chen, Zhang</au><au>Jian-Nan, Hu</au><au>Yi, Luo</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>High Quality A1N with a Thin Interlayer Grown on a Sapphire Substrate by Plasma-Assisted Molecular Beam Epitaxy</atitle><jtitle>Chinese physics letters</jtitle><addtitle>Chinese Physics Letters</addtitle><date>2010-06-01</date><risdate>2010</risdate><volume>27</volume><issue>6</issue><spage>233</spage><epage>236</epage><pages>233-236</pages><issn>0256-307X</issn><eissn>1741-3540</eissn><abstract>We report an AIN epi-layer grown on sapphire by plasma-assisted molecular beam epitaxy with a thin interlayer structure. The effects of growth mode on threading dislocations (TDs) and surface morphology are studied. Then an interlayer structure grown under a V/Ⅲ ratio of 1 is adopted to improve the AIN crystalline quality. By optimizing the thickness of the interlayer, the TD density and surface roughness can be reduced simultaneously.</abstract><pub>IOP Publishing</pub><doi>10.1088/0256-307X/27/6/068101</doi><tpages>4</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0256-307X
ispartof Chinese physics letters, 2010-06, Vol.27 (6), p.233-236
issn 0256-307X
1741-3540
language eng
recordid cdi_chongqing_backfile_33956774
source IOP Publishing Journals; Institute of Physics (IOP) Journals - HEAL-Link
subjects AIN
夹层结构
等离子体辅助分子束外延
蓝宝石衬底
薄夹层
表面粗糙度
title High Quality A1N with a Thin Interlayer Grown on a Sapphire Substrate by Plasma-Assisted Molecular Beam Epitaxy
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-03T09%3A00%3A12IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-iop_chong&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=High%20Quality%20A1N%20with%20a%20Thin%20Interlayer%20Grown%20on%20a%20Sapphire%20Substrate%20by%20Plasma-Assisted%20Molecular%20Beam%20Epitaxy&rft.jtitle=Chinese%20physics%20letters&rft.au=Fan,%20Ren&rft.date=2010-06-01&rft.volume=27&rft.issue=6&rft.spage=233&rft.epage=236&rft.pages=233-236&rft.issn=0256-307X&rft.eissn=1741-3540&rft_id=info:doi/10.1088/0256-307X/27/6/068101&rft_dat=%3Ciop_chong%3E10_1088_0256_307X_27_6_068101%3C/iop_chong%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_cqvip_id=33956774&rfr_iscdi=true