Modeling and discussion of threshold voltage for a multi-floating gate FET pH sensor
Research into new pH sensors fabricated by the standard CMOS process is currently a hot topic. The new pH sensing multi-floating gate field effect transistor is found to have a very large threshold voltage, which is different from the normal ion-sensitive field effect transistor. After analyzing all...
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Veröffentlicht in: | Journal of semiconductors 2009-11, Vol.30 (11), p.71-74 |
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description | Research into new pH sensors fabricated by the standard CMOS process is currently a hot topic. The new pH sensing multi-floating gate field effect transistor is found to have a very large threshold voltage, which is different from the normal ion-sensitive field effect transistor. After analyzing all the interface layers of the structure, a new sensitive model based on the Gauss theorem and the charge neutrality principle is created in this paper. According to the model, the charge trapped on the multi-floating gate during the process and the thickness of the sensitive layer are the main causes of the large threshold voltage. From this model, it is also found that removing the charge on the multi-floating gate is an effective way to decrease the threshold voltage. The test results for three different standard pH buffer solutions show the correctness of the model and point the way to solve the large threshold problem. |
doi_str_mv | 10.1088/1674-4926/30/11/114011 |
format | Article |
fullrecord | <record><control><sourceid>iop_chong</sourceid><recordid>TN_cdi_chongqing_backfile_32337831</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><cqvip_id>32337831</cqvip_id><sourcerecordid>10_1088_1674_4926_30_11_114011</sourcerecordid><originalsourceid>FETCH-LOGICAL-c271t-bfb8440a3b652652550d7c3ab09fecfc666f1ee0bc2054f242b218f226efd9303</originalsourceid><addsrcrecordid>eNqNkE9LAzEQxXNQsNR-BQne15382ezuUYpaoeKlnkOSTbaL6aYmW8Fvb5YWz8KDgXnzm-ENQncEHgg0TUlEzQveUlEyKAnJ4kDIFVr8GTdoldKgAdqmYRxggXZvobN-GHusxg53QzKnPBFGHBye9tGmffAd_g5-Ur3FLkSs8OHkp6FwPqhpBns1Wfz8tMPHDU52TCHeomunfLKrS12ij-yvN8X2_eV1_bgtDK3JVGinG85BMS0qmlVV0NWGKQ2ts8YZIYQj1oI2FCruKKeaksZRKqzrWgZsicR5r4khpWidPMbhoOKPJCDnl8g5uZyTS5Y7RJ5fkkFyBodw_D9zfzm2D2P_lZNLrcynG7yVjDJWN4ywX6cecAA</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Modeling and discussion of threshold voltage for a multi-floating gate FET pH sensor</title><source>IOP Publishing Journals</source><source>Alma/SFX Local Collection</source><creator>施朝霞 朱大中</creator><creatorcontrib>施朝霞 朱大中</creatorcontrib><description>Research into new pH sensors fabricated by the standard CMOS process is currently a hot topic. The new pH sensing multi-floating gate field effect transistor is found to have a very large threshold voltage, which is different from the normal ion-sensitive field effect transistor. After analyzing all the interface layers of the structure, a new sensitive model based on the Gauss theorem and the charge neutrality principle is created in this paper. According to the model, the charge trapped on the multi-floating gate during the process and the thickness of the sensitive layer are the main causes of the large threshold voltage. From this model, it is also found that removing the charge on the multi-floating gate is an effective way to decrease the threshold voltage. The test results for three different standard pH buffer solutions show the correctness of the model and point the way to solve the large threshold problem.</description><identifier>ISSN: 1674-4926</identifier><identifier>DOI: 10.1088/1674-4926/30/11/114011</identifier><language>eng</language><publisher>IOP Publishing</publisher><subject>pH传感器 ; pH值传感器 ; 动栅 ; 场效应管 ; 工艺制造 ; 建模 ; 离子敏感场效应晶体管 ; 阈值电压</subject><ispartof>Journal of semiconductors, 2009-11, Vol.30 (11), p.71-74</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c271t-bfb8440a3b652652550d7c3ab09fecfc666f1ee0bc2054f242b218f226efd9303</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Uhttp://image.cqvip.com/vip1000/qk/94689X/94689X.jpg</thumbnail><linktopdf>$$Uhttps://iopscience.iop.org/article/10.1088/1674-4926/30/11/114011/pdf$$EPDF$$P50$$Giop$$H</linktopdf><link.rule.ids>314,776,780,27901,27902,53885</link.rule.ids></links><search><creatorcontrib>施朝霞 朱大中</creatorcontrib><title>Modeling and discussion of threshold voltage for a multi-floating gate FET pH sensor</title><title>Journal of semiconductors</title><addtitle>Chinese Journal of Semiconductors</addtitle><description>Research into new pH sensors fabricated by the standard CMOS process is currently a hot topic. The new pH sensing multi-floating gate field effect transistor is found to have a very large threshold voltage, which is different from the normal ion-sensitive field effect transistor. After analyzing all the interface layers of the structure, a new sensitive model based on the Gauss theorem and the charge neutrality principle is created in this paper. According to the model, the charge trapped on the multi-floating gate during the process and the thickness of the sensitive layer are the main causes of the large threshold voltage. From this model, it is also found that removing the charge on the multi-floating gate is an effective way to decrease the threshold voltage. The test results for three different standard pH buffer solutions show the correctness of the model and point the way to solve the large threshold problem.</description><subject>pH传感器</subject><subject>pH值传感器</subject><subject>动栅</subject><subject>场效应管</subject><subject>工艺制造</subject><subject>建模</subject><subject>离子敏感场效应晶体管</subject><subject>阈值电压</subject><issn>1674-4926</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2009</creationdate><recordtype>article</recordtype><recordid>eNqNkE9LAzEQxXNQsNR-BQne15382ezuUYpaoeKlnkOSTbaL6aYmW8Fvb5YWz8KDgXnzm-ENQncEHgg0TUlEzQveUlEyKAnJ4kDIFVr8GTdoldKgAdqmYRxggXZvobN-GHusxg53QzKnPBFGHBye9tGmffAd_g5-Ur3FLkSs8OHkp6FwPqhpBns1Wfz8tMPHDU52TCHeomunfLKrS12ij-yvN8X2_eV1_bgtDK3JVGinG85BMS0qmlVV0NWGKQ2ts8YZIYQj1oI2FCruKKeaksZRKqzrWgZsicR5r4khpWidPMbhoOKPJCDnl8g5uZyTS5Y7RJ5fkkFyBodw_D9zfzm2D2P_lZNLrcynG7yVjDJWN4ywX6cecAA</recordid><startdate>20091101</startdate><enddate>20091101</enddate><creator>施朝霞 朱大中</creator><general>IOP Publishing</general><scope>2RA</scope><scope>92L</scope><scope>CQIGP</scope><scope>W92</scope><scope>~WA</scope><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20091101</creationdate><title>Modeling and discussion of threshold voltage for a multi-floating gate FET pH sensor</title><author>施朝霞 朱大中</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c271t-bfb8440a3b652652550d7c3ab09fecfc666f1ee0bc2054f242b218f226efd9303</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2009</creationdate><topic>pH传感器</topic><topic>pH值传感器</topic><topic>动栅</topic><topic>场效应管</topic><topic>工艺制造</topic><topic>建模</topic><topic>离子敏感场效应晶体管</topic><topic>阈值电压</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>施朝霞 朱大中</creatorcontrib><collection>中文科技期刊数据库</collection><collection>中文科技期刊数据库-CALIS站点</collection><collection>中文科技期刊数据库-7.0平台</collection><collection>中文科技期刊数据库-工程技术</collection><collection>中文科技期刊数据库- 镜像站点</collection><collection>CrossRef</collection><jtitle>Journal of semiconductors</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>施朝霞 朱大中</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Modeling and discussion of threshold voltage for a multi-floating gate FET pH sensor</atitle><jtitle>Journal of semiconductors</jtitle><addtitle>Chinese Journal of Semiconductors</addtitle><date>2009-11-01</date><risdate>2009</risdate><volume>30</volume><issue>11</issue><spage>71</spage><epage>74</epage><pages>71-74</pages><issn>1674-4926</issn><abstract>Research into new pH sensors fabricated by the standard CMOS process is currently a hot topic. The new pH sensing multi-floating gate field effect transistor is found to have a very large threshold voltage, which is different from the normal ion-sensitive field effect transistor. After analyzing all the interface layers of the structure, a new sensitive model based on the Gauss theorem and the charge neutrality principle is created in this paper. According to the model, the charge trapped on the multi-floating gate during the process and the thickness of the sensitive layer are the main causes of the large threshold voltage. From this model, it is also found that removing the charge on the multi-floating gate is an effective way to decrease the threshold voltage. The test results for three different standard pH buffer solutions show the correctness of the model and point the way to solve the large threshold problem.</abstract><pub>IOP Publishing</pub><doi>10.1088/1674-4926/30/11/114011</doi><tpages>4</tpages></addata></record> |
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subjects | pH传感器 pH值传感器 动栅 场效应管 工艺制造 建模 离子敏感场效应晶体管 阈值电压 |
title | Modeling and discussion of threshold voltage for a multi-floating gate FET pH sensor |
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