AFM-Based Observation and Robotic Nano-Manipulation

This book highlights the latest advances in AFM nano-manipulation research in the field of nanotechnology. There are numerous uncertainties in the AFM nano-manipulation environment, such as thermal drift, tip broadening effect, tip positioning errors and manipulation instability. This book proposes...

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Hauptverfasser: Yuan, Shuai, Liu, Lianqing, Wang, Zhidong, Xi, Ning
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Liu, Lianqing
Wang, Zhidong
Xi, Ning
description This book highlights the latest advances in AFM nano-manipulation research in the field of nanotechnology. There are numerous uncertainties in the AFM nano-manipulation environment, such as thermal drift, tip broadening effect, tip positioning errors and manipulation instability. This book proposes a method for estimating tip morphology using a blind modeling algorithm, which is the basis of the analysis of the influence of thermal drift on AFM scanning images, and also explains how the scanning image of AFM is reconstructed with better accuracy. Further, the book describes how the tip positioning errors caused by thermal drift and system nonlinearity can be corrected using the proposed landmark observation method, and also explores the tip path planning method in a complex environment. Lastly, it presents an AFM-based nano-manipulation platform to illustrate the effectiveness of the proposed method using theoretical research, such as tip positioning and virtual nano-hand.
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fullrecord <record><control><sourceid>proquest_askew</sourceid><recordid>TN_cdi_askewsholts_vlebooks_9789811505089</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EBC6109954</sourcerecordid><originalsourceid>FETCH-LOGICAL-a18541-b289acda67fea05a85f46c8518872c083495625bebe3eb0cbdcc0791602eacfb3</originalsourceid><addsrcrecordid>eNpVkEFPwzAMhYMQCDb2A7j1hjiE2W2TJsdt2gCJMQkhrlGSplBWNaPpxt-nXeHAyfbz955kE3KNcIcA2VRmgkqBFBkFBl1_Qiad1knIekGektHfkOE5GSGm3cATkBdkEsInAMSx4CnDS5LMVms618Hl0cYE1xx0W_o60nUevXjj29JGz7r2dK3rcrevjtsrclboKrjJbx2Tt9XydfFAnzb3j4vZE9UoWIrUxEJqm2ueFU4D04IVKbeCoRBZbEEkqWQ8ZsYZlzgD1uTWQiaRQ-y0LUwyJrdDsA5b9x0-fNUGdaic8X4b1L-bO3Y6sGHXlPW7a9RAIaj-az2tOlwhU71B9Y6bwbFr_NfehVYdg62r20ZXajlfcAQpWZr8AI9zZ-k</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>book</recordtype><pqid>EBC6109954</pqid></control><display><type>book</type><title>AFM-Based Observation and Robotic Nano-Manipulation</title><source>Springer Books</source><creator>Yuan, Shuai ; Liu, Lianqing ; Wang, Zhidong ; Xi, Ning</creator><creatorcontrib>Yuan, Shuai ; Liu, Lianqing ; Wang, Zhidong ; Xi, Ning</creatorcontrib><description>This book highlights the latest advances in AFM nano-manipulation research in the field of nanotechnology. There are numerous uncertainties in the AFM nano-manipulation environment, such as thermal drift, tip broadening effect, tip positioning errors and manipulation instability. This book proposes a method for estimating tip morphology using a blind modeling algorithm, which is the basis of the analysis of the influence of thermal drift on AFM scanning images, and also explains how the scanning image of AFM is reconstructed with better accuracy. Further, the book describes how the tip positioning errors caused by thermal drift and system nonlinearity can be corrected using the proposed landmark observation method, and also explores the tip path planning method in a complex environment. Lastly, it presents an AFM-based nano-manipulation platform to illustrate the effectiveness of the proposed method using theoretical research, such as tip positioning and virtual nano-hand.</description><edition>1st ed. 2020.</edition><identifier>ISBN: 9811505071</identifier><identifier>ISBN: 9789811505072</identifier><identifier>EISBN: 9789811505089</identifier><identifier>EISBN: 981150508X</identifier><identifier>DOI: 10.1007/978-981-15-0508-9</identifier><identifier>OCLC: 1141506309</identifier><language>eng</language><publisher>Singapore: Springer Singapore Pte. Limited</publisher><subject>Characterization and Evaluation of Materials ; Chemistry and Materials Science ; Materials Science ; Nanoscale Science and Technology ; Nanotechnology ; Nanotechnology and Microengineering</subject><creationdate>2020</creationdate><tpages>189</tpages><format>189</format><rights>Science Press and Springer Nature Singapore Pte Ltd. 2020</rights><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Uhttps://media.springernature.com/w306/springer-static/cover-hires/book/978-981-15-0508-9</thumbnail><linktohtml>$$Uhttps://link.springer.com/10.1007/978-981-15-0508-9$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>306,780,784,786,27925,38255,42511</link.rule.ids></links><search><creatorcontrib>Yuan, Shuai</creatorcontrib><creatorcontrib>Liu, Lianqing</creatorcontrib><creatorcontrib>Wang, Zhidong</creatorcontrib><creatorcontrib>Xi, Ning</creatorcontrib><title>AFM-Based Observation and Robotic Nano-Manipulation</title><description>This book highlights the latest advances in AFM nano-manipulation research in the field of nanotechnology. There are numerous uncertainties in the AFM nano-manipulation environment, such as thermal drift, tip broadening effect, tip positioning errors and manipulation instability. This book proposes a method for estimating tip morphology using a blind modeling algorithm, which is the basis of the analysis of the influence of thermal drift on AFM scanning images, and also explains how the scanning image of AFM is reconstructed with better accuracy. Further, the book describes how the tip positioning errors caused by thermal drift and system nonlinearity can be corrected using the proposed landmark observation method, and also explores the tip path planning method in a complex environment. Lastly, it presents an AFM-based nano-manipulation platform to illustrate the effectiveness of the proposed method using theoretical research, such as tip positioning and virtual nano-hand.</description><subject>Characterization and Evaluation of Materials</subject><subject>Chemistry and Materials Science</subject><subject>Materials Science</subject><subject>Nanoscale Science and Technology</subject><subject>Nanotechnology</subject><subject>Nanotechnology and Microengineering</subject><isbn>9811505071</isbn><isbn>9789811505072</isbn><isbn>9789811505089</isbn><isbn>981150508X</isbn><fulltext>true</fulltext><rsrctype>book</rsrctype><creationdate>2020</creationdate><recordtype>book</recordtype><sourceid/><recordid>eNpVkEFPwzAMhYMQCDb2A7j1hjiE2W2TJsdt2gCJMQkhrlGSplBWNaPpxt-nXeHAyfbz955kE3KNcIcA2VRmgkqBFBkFBl1_Qiad1knIekGektHfkOE5GSGm3cATkBdkEsInAMSx4CnDS5LMVms618Hl0cYE1xx0W_o60nUevXjj29JGz7r2dK3rcrevjtsrclboKrjJbx2Tt9XydfFAnzb3j4vZE9UoWIrUxEJqm2ueFU4D04IVKbeCoRBZbEEkqWQ8ZsYZlzgD1uTWQiaRQ-y0LUwyJrdDsA5b9x0-fNUGdaic8X4b1L-bO3Y6sGHXlPW7a9RAIaj-az2tOlwhU71B9Y6bwbFr_NfehVYdg62r20ZXajlfcAQpWZr8AI9zZ-k</recordid><startdate>2020</startdate><enddate>2020</enddate><creator>Yuan, Shuai</creator><creator>Liu, Lianqing</creator><creator>Wang, Zhidong</creator><creator>Xi, Ning</creator><general>Springer Singapore Pte. Limited</general><general>Springer Singapore</general><general>Springer</general><scope/></search><sort><creationdate>2020</creationdate><title>AFM-Based Observation and Robotic Nano-Manipulation</title><author>Yuan, Shuai ; Liu, Lianqing ; Wang, Zhidong ; Xi, Ning</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-a18541-b289acda67fea05a85f46c8518872c083495625bebe3eb0cbdcc0791602eacfb3</frbrgroupid><rsrctype>books</rsrctype><prefilter>books</prefilter><language>eng</language><creationdate>2020</creationdate><topic>Characterization and Evaluation of Materials</topic><topic>Chemistry and Materials Science</topic><topic>Materials Science</topic><topic>Nanoscale Science and Technology</topic><topic>Nanotechnology</topic><topic>Nanotechnology and Microengineering</topic><toplevel>online_resources</toplevel><creatorcontrib>Yuan, Shuai</creatorcontrib><creatorcontrib>Liu, Lianqing</creatorcontrib><creatorcontrib>Wang, Zhidong</creatorcontrib><creatorcontrib>Xi, Ning</creatorcontrib></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Yuan, Shuai</au><au>Liu, Lianqing</au><au>Wang, Zhidong</au><au>Xi, Ning</au><format>book</format><genre>book</genre><ristype>BOOK</ristype><btitle>AFM-Based Observation and Robotic Nano-Manipulation</btitle><date>2020</date><risdate>2020</risdate><isbn>9811505071</isbn><isbn>9789811505072</isbn><eisbn>9789811505089</eisbn><eisbn>981150508X</eisbn><abstract>This book highlights the latest advances in AFM nano-manipulation research in the field of nanotechnology. There are numerous uncertainties in the AFM nano-manipulation environment, such as thermal drift, tip broadening effect, tip positioning errors and manipulation instability. This book proposes a method for estimating tip morphology using a blind modeling algorithm, which is the basis of the analysis of the influence of thermal drift on AFM scanning images, and also explains how the scanning image of AFM is reconstructed with better accuracy. Further, the book describes how the tip positioning errors caused by thermal drift and system nonlinearity can be corrected using the proposed landmark observation method, and also explores the tip path planning method in a complex environment. Lastly, it presents an AFM-based nano-manipulation platform to illustrate the effectiveness of the proposed method using theoretical research, such as tip positioning and virtual nano-hand.</abstract><cop>Singapore</cop><pub>Springer Singapore Pte. Limited</pub><doi>10.1007/978-981-15-0508-9</doi><oclcid>1141506309</oclcid><tpages>189</tpages><edition>1st ed. 2020.</edition></addata></record>
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subjects Characterization and Evaluation of Materials
Chemistry and Materials Science
Materials Science
Nanoscale Science and Technology
Nanotechnology
Nanotechnology and Microengineering
title AFM-Based Observation and Robotic Nano-Manipulation
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-06T13%3A37%3A52IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_askew&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=book&rft.btitle=AFM-Based%20Observation%20and%20Robotic%20Nano-Manipulation&rft.au=Yuan,%20Shuai&rft.date=2020&rft.isbn=9811505071&rft.isbn_list=9789811505072&rft_id=info:doi/10.1007/978-981-15-0508-9&rft_dat=%3Cproquest_askew%3EEBC6109954%3C/proquest_askew%3E%3Curl%3E%3C/url%3E&rft.eisbn=9789811505089&rft.eisbn_list=981150508X&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=EBC6109954&rft_id=info:pmid/&rfr_iscdi=true