Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization

This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution.

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Bibliographische Detailangaben
Hauptverfasser:	Brodusch, Nicolas, Demers, Hendrix, Gauvin, Raynald
Format:	Buch
Sprache:	eng
Schlagworte:	Characterization and Evaluation of Materials Chemistry and Materials Science Materials Science Nanotechnology and Microengineering Scanning electron microscopy Spectroscopy and Microscopy
Online-Zugang:	Volltext
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Beschreibung
Zusammenfassung:	This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution.
ISSN:	2191-530X 2191-5318
DOI:	10.1007/978-981-10-4433-5