$Transmission Electron Microscopy and Diffractometry of Materials$

Transmission Electron Microscopy and Diffractometry of Materials

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The third edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of th...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	Fultz, Brent, Howe, James M
Format:	Buch
Sprache:	eng
Schlagworte:	Characterization and Evaluation of Materials Chemistry and Materials Science Crystallography and Scattering Methods Engineering & allied operations Engineering, general Materials Materials Science Materials-Microscopy Microscopy Solid State Physics Spectroscopy and Microscopy Surfaces and Interfaces, Thin Films Transmission electron microscopy X-ray diffractometer
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The third edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM.
DOI:	10.1007/978-3-540-73886-2