Pattern Recognition with Support Vector Machines: First International Workshop, SVM 2002, Niagara Falls, Canada, August 10, 2002. Proceedings

This book constitutes the refereed proceedings of the First International Workshop on Pattern Recognition with Support Vector Machines, SVM 2002, held in Niagara Falls, Canada in August 2002.The 16 revised full papers and 14 poster papers presented together with two invited contributions were carefu...

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Bibliographische Detailangaben

Hauptverfasser:	Lee, Seong-Whan, Verri, Alessandro
Format:	Buch
Sprache:	eng
Schlagworte:	Algorithm Analysis and Problem Complexity Artificial Intelligence Computation by Abstract Devices Computer Science Computer software Computer vision Congresses Image Processing and Computer Vision Machine learning Mathematical statistics Optical pattern recognition Pattern Recognition Pattern recognition systems Statistics and Computing/Statistics Programs
Online-Zugang:	Volltext
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