High Dielectric Constant Materials: VLSI MOSFET Applications

Issues relating to the high-K gate dielectric are among the greatest challenges for the evolving International Technology Roadmap for Semiconductors (ITRS). More than just an historical overview, this book will assess previous and present approaches related to scaling the gate dielectric and their i...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Huff, H.R, Gilmer, D.C
Format: Buch
Sprache:eng
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