Electric Field Effect Analysis of Thin PbTe films on high-epsilon SrTiO3 Substrate

Thin PbTe films (thickness 500 - 600 angstrom), deposited on SrTiO3, have been investigated by electric field effect (EFE). The high resistivity of such thin films warrants a high sensitivity of the EFE method. The SrTiO3 substrate serves as the dielectric layer in the Gate-Dielectric-PbTe structure...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Butenko, A. V, Kahatabi, R, Sandomirsky, V, Schlesinger, Y, Sipatov, A. Yu, Volubuev, V. V
Format:	Artikel
Sprache:	eng
Schlagworte:	Physics - Other Condensed Matter
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!