Enhancing Apple's Defect Classification: Insights from Visible Spectrum and Narrow Spectral Band Imaging

This study addresses the classification of defects in apples as a crucial measure to mitigate economic losses and optimize the food supply chain. An innovative approach is employed that integrates images from the visible spectrum and 660 nm spectral wavelength to enhance accuracy and efficiency in d...

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Veröffentlicht in:	arXiv.org 2024-10
Hauptverfasser:	Coello, Omar, Coronel, Moisés, Carpio, Darío, Vintimilla, Boris, Chuquimarca, Luis
Format:	Artikel
Sprache:	eng
Schlagworte:	Artificial neural networks Classification Computer Science - Computer Vision and Pattern Recognition Computer Science - Learning Defects Economic impact Image acquisition Image enhancement Image filters Performance evaluation Supply chains Visible spectrum
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