Sparks of Artificial General Intelligence(AGI) in Semiconductor Material Science: Early Explorations into the Next Frontier of Generative AI-Assisted Electron Micrograph Analysis

Characterizing materials with electron micrographs poses significant challenges for automated labeling due to the complex nature of nanomaterial structures. To address this, we introduce a fully automated, end-to-end pipeline that leverages recent advances in Generative AI. It is designed for analyz...

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Hauptverfasser:	Srinivas, Sakhinana Sagar, Sannidhi, Geethan, Gangasani, Sreeja, Ravuru, Chidaksh, Runkana, Venkataramana
Format:	Artikel
Sprache:	eng
Schlagworte:	Computer Science - Artificial Intelligence Computer Science - Computer Vision and Pattern Recognition Computer Science - Learning
Online-Zugang:	Volltext bestellen
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