Imaging nanomechanical vibrations and manipulating parametric mode coupling via scanning microwave microscopy
In this study, we present a novel platform based on scanning microwave microscopy for manipulating and detecting tiny vibrations of nanoelectromechanical resonators using a single metallic tip. The tip is placed on the top of a grounded silicon nitride membrane, acting as a movable top gate of the c...
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| creator | Xu, Hao Venkatachalam, Srisaran Toky-Harrison Rabenimanana Boyaval, Christophe Eliet, Sophie Braud, Flavie Eddy, Collin Theron, Didier Zhou, Xin |
| description | In this study, we present a novel platform based on scanning microwave microscopy for manipulating and detecting tiny vibrations of nanoelectromechanical resonators using a single metallic tip. The tip is placed on the top of a grounded silicon nitride membrane, acting as a movable top gate of the coupled resonator. We demonstrate its ability to map mechanical modes and investigate mechanical damping effects in a capacitive coupling scheme, based on its spatial resolution. We also manipulate the energy transfer coherently between the mode of the scanning tip and the underlying silicon nitride membrane, via parametric coupling. Typical features of optomechanics, such as anti-damping and electromechanically induced transparency, have been observed. Since the microwave optomechanical technology is fully compatible with quantum electronics and very low temperature conditions, it should provide a powerful tool for studying phonon tunnelling between two spatially separated vibrating elements, which could potentially be applied to quantum sensing. |
| doi_str_mv | 10.48550/arxiv.2407.00239 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_arxiv</sourceid><recordid>TN_cdi_arxiv_primary_2407_00239</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>3075439770</sourcerecordid><originalsourceid>FETCH-LOGICAL-a520-91583aad52e04531a8b40250715d8e2f371e84d1ad9c2bd86495396e51390b9d3</originalsourceid><addsrcrecordid>eNotkMtqwzAQRUWh0JDmA7qqoWu7esbSsoQ-AoFusjdjSUkVLMmVYrf5-zpJVzNz5jIMB6EHgisuhcDPkH7dWFGO6wpjytQNmlHGSCk5pXdokfMBT3xZUyHYDPm1h70L-yJAiN7qLwhOQ1eMrk1wdDHkAoIp_IT7oZvIFO0hgbfH5HTho7GFjkPfnRejgyJrCOE8eKdT_IHRXrusY3-6R7c76LJd_Nc52r69blcf5ebzfb162ZQgKC4VEZIBGEEt5oIRkC3HVOCaCCMt3bGaWMkNAaM0bY1cciWYWlpBmMKtMmyOHq9nLy6aPjkP6dScnTQXJ1Pi6ZroU_webD42hzikMP3UMFwLzlRdY_YHEJRl-w</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>3075439770</pqid></control><display><type>article</type><title>Imaging nanomechanical vibrations and manipulating parametric mode coupling via scanning microwave microscopy</title><source>arXiv.org</source><source>Free E- Journals</source><creator>Xu, Hao ; Venkatachalam, Srisaran ; Toky-Harrison Rabenimanana ; Boyaval, Christophe ; Eliet, Sophie ; Braud, Flavie ; Eddy, Collin ; Theron, Didier ; Zhou, Xin</creator><creatorcontrib>Xu, Hao ; Venkatachalam, Srisaran ; Toky-Harrison Rabenimanana ; Boyaval, Christophe ; Eliet, Sophie ; Braud, Flavie ; Eddy, Collin ; Theron, Didier ; Zhou, Xin</creatorcontrib><description>In this study, we present a novel platform based on scanning microwave microscopy for manipulating and detecting tiny vibrations of nanoelectromechanical resonators using a single metallic tip. The tip is placed on the top of a grounded silicon nitride membrane, acting as a movable top gate of the coupled resonator. We demonstrate its ability to map mechanical modes and investigate mechanical damping effects in a capacitive coupling scheme, based on its spatial resolution. We also manipulate the energy transfer coherently between the mode of the scanning tip and the underlying silicon nitride membrane, via parametric coupling. Typical features of optomechanics, such as anti-damping and electromechanically induced transparency, have been observed. Since the microwave optomechanical technology is fully compatible with quantum electronics and very low temperature conditions, it should provide a powerful tool for studying phonon tunnelling between two spatially separated vibrating elements, which could potentially be applied to quantum sensing.</description><identifier>EISSN: 2331-8422</identifier><identifier>DOI: 10.48550/arxiv.2407.00239</identifier><language>eng</language><publisher>Ithaca: Cornell University Library, arXiv.org</publisher><subject>Coupled modes ; Coupling ; Damping ; Energy transfer ; Low temperature ; Membranes ; Microscopy ; Opto-mechanics ; Physics - Applied Physics ; Physics - Instrumentation and Detectors ; Quantum electronics ; Resonators ; Silicon nitride ; Spatial resolution</subject><ispartof>arXiv.org, 2024-06</ispartof><rights>2024. This work is published under http://arxiv.org/licenses/nonexclusive-distrib/1.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.</rights><rights>http://arxiv.org/licenses/nonexclusive-distrib/1.0</rights><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>228,230,780,784,885,27925</link.rule.ids><backlink>$$Uhttps://doi.org/10.1021/acs.nanolett.4c01401$$DView published paper (Access to full text may be restricted)$$Hfree_for_read</backlink><backlink>$$Uhttps://doi.org/10.48550/arXiv.2407.00239$$DView paper in arXiv$$Hfree_for_read</backlink></links><search><creatorcontrib>Xu, Hao</creatorcontrib><creatorcontrib>Venkatachalam, Srisaran</creatorcontrib><creatorcontrib>Toky-Harrison Rabenimanana</creatorcontrib><creatorcontrib>Boyaval, Christophe</creatorcontrib><creatorcontrib>Eliet, Sophie</creatorcontrib><creatorcontrib>Braud, Flavie</creatorcontrib><creatorcontrib>Eddy, Collin</creatorcontrib><creatorcontrib>Theron, Didier</creatorcontrib><creatorcontrib>Zhou, Xin</creatorcontrib><title>Imaging nanomechanical vibrations and manipulating parametric mode coupling via scanning microwave microscopy</title><title>arXiv.org</title><description>In this study, we present a novel platform based on scanning microwave microscopy for manipulating and detecting tiny vibrations of nanoelectromechanical resonators using a single metallic tip. The tip is placed on the top of a grounded silicon nitride membrane, acting as a movable top gate of the coupled resonator. We demonstrate its ability to map mechanical modes and investigate mechanical damping effects in a capacitive coupling scheme, based on its spatial resolution. We also manipulate the energy transfer coherently between the mode of the scanning tip and the underlying silicon nitride membrane, via parametric coupling. Typical features of optomechanics, such as anti-damping and electromechanically induced transparency, have been observed. Since the microwave optomechanical technology is fully compatible with quantum electronics and very low temperature conditions, it should provide a powerful tool for studying phonon tunnelling between two spatially separated vibrating elements, which could potentially be applied to quantum sensing.</description><subject>Coupled modes</subject><subject>Coupling</subject><subject>Damping</subject><subject>Energy transfer</subject><subject>Low temperature</subject><subject>Membranes</subject><subject>Microscopy</subject><subject>Opto-mechanics</subject><subject>Physics - Applied Physics</subject><subject>Physics - Instrumentation and Detectors</subject><subject>Quantum electronics</subject><subject>Resonators</subject><subject>Silicon nitride</subject><subject>Spatial resolution</subject><issn>2331-8422</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2024</creationdate><recordtype>article</recordtype><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><sourceid>GOX</sourceid><recordid>eNotkMtqwzAQRUWh0JDmA7qqoWu7esbSsoQ-AoFusjdjSUkVLMmVYrf5-zpJVzNz5jIMB6EHgisuhcDPkH7dWFGO6wpjytQNmlHGSCk5pXdokfMBT3xZUyHYDPm1h70L-yJAiN7qLwhOQ1eMrk1wdDHkAoIp_IT7oZvIFO0hgbfH5HTho7GFjkPfnRejgyJrCOE8eKdT_IHRXrusY3-6R7c76LJd_Nc52r69blcf5ebzfb162ZQgKC4VEZIBGEEt5oIRkC3HVOCaCCMt3bGaWMkNAaM0bY1cciWYWlpBmMKtMmyOHq9nLy6aPjkP6dScnTQXJ1Pi6ZroU_webD42hzikMP3UMFwLzlRdY_YHEJRl-w</recordid><startdate>20240628</startdate><enddate>20240628</enddate><creator>Xu, Hao</creator><creator>Venkatachalam, Srisaran</creator><creator>Toky-Harrison Rabenimanana</creator><creator>Boyaval, Christophe</creator><creator>Eliet, Sophie</creator><creator>Braud, Flavie</creator><creator>Eddy, Collin</creator><creator>Theron, Didier</creator><creator>Zhou, Xin</creator><general>Cornell University Library, arXiv.org</general><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>HCIFZ</scope><scope>L6V</scope><scope>M7S</scope><scope>PIMPY</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>PTHSS</scope><scope>GOX</scope></search><sort><creationdate>20240628</creationdate><title>Imaging nanomechanical vibrations and manipulating parametric mode coupling via scanning microwave microscopy</title><author>Xu, Hao ; Venkatachalam, Srisaran ; Toky-Harrison Rabenimanana ; Boyaval, Christophe ; Eliet, Sophie ; Braud, Flavie ; Eddy, Collin ; Theron, Didier ; Zhou, Xin</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-a520-91583aad52e04531a8b40250715d8e2f371e84d1ad9c2bd86495396e51390b9d3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2024</creationdate><topic>Coupled modes</topic><topic>Coupling</topic><topic>Damping</topic><topic>Energy transfer</topic><topic>Low temperature</topic><topic>Membranes</topic><topic>Microscopy</topic><topic>Opto-mechanics</topic><topic>Physics - Applied Physics</topic><topic>Physics - Instrumentation and Detectors</topic><topic>Quantum electronics</topic><topic>Resonators</topic><topic>Silicon nitride</topic><topic>Spatial resolution</topic><toplevel>online_resources</toplevel><creatorcontrib>Xu, Hao</creatorcontrib><creatorcontrib>Venkatachalam, Srisaran</creatorcontrib><creatorcontrib>Toky-Harrison Rabenimanana</creatorcontrib><creatorcontrib>Boyaval, Christophe</creatorcontrib><creatorcontrib>Eliet, Sophie</creatorcontrib><creatorcontrib>Braud, Flavie</creatorcontrib><creatorcontrib>Eddy, Collin</creatorcontrib><creatorcontrib>Theron, Didier</creatorcontrib><creatorcontrib>Zhou, Xin</creatorcontrib><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central UK/Ireland</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>SciTech Premium Collection</collection><collection>ProQuest Engineering Collection</collection><collection>Engineering Database</collection><collection>Publicly Available Content Database</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>Engineering Collection</collection><collection>arXiv.org</collection><jtitle>arXiv.org</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Xu, Hao</au><au>Venkatachalam, Srisaran</au><au>Toky-Harrison Rabenimanana</au><au>Boyaval, Christophe</au><au>Eliet, Sophie</au><au>Braud, Flavie</au><au>Eddy, Collin</au><au>Theron, Didier</au><au>Zhou, Xin</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Imaging nanomechanical vibrations and manipulating parametric mode coupling via scanning microwave microscopy</atitle><jtitle>arXiv.org</jtitle><date>2024-06-28</date><risdate>2024</risdate><eissn>2331-8422</eissn><abstract>In this study, we present a novel platform based on scanning microwave microscopy for manipulating and detecting tiny vibrations of nanoelectromechanical resonators using a single metallic tip. The tip is placed on the top of a grounded silicon nitride membrane, acting as a movable top gate of the coupled resonator. We demonstrate its ability to map mechanical modes and investigate mechanical damping effects in a capacitive coupling scheme, based on its spatial resolution. We also manipulate the energy transfer coherently between the mode of the scanning tip and the underlying silicon nitride membrane, via parametric coupling. Typical features of optomechanics, such as anti-damping and electromechanically induced transparency, have been observed. Since the microwave optomechanical technology is fully compatible with quantum electronics and very low temperature conditions, it should provide a powerful tool for studying phonon tunnelling between two spatially separated vibrating elements, which could potentially be applied to quantum sensing.</abstract><cop>Ithaca</cop><pub>Cornell University Library, arXiv.org</pub><doi>10.48550/arxiv.2407.00239</doi><oa>free_for_read</oa></addata></record> |
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| subjects | Coupled modes Coupling Damping Energy transfer Low temperature Membranes Microscopy Opto-mechanics Physics - Applied Physics Physics - Instrumentation and Detectors Quantum electronics Resonators Silicon nitride Spatial resolution |
| title | Imaging nanomechanical vibrations and manipulating parametric mode coupling via scanning microwave microscopy |
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