ViPErLEED package II: Spot tracking, extraction and processing of I(V) curves
As part of the ViPErLEED project (Vienna package for Erlangen LEED, low-energy electron diffraction), computer programs have been developed for facile and user-friendly data extraction from movies of LEED images. The programs make use of some concepts from astronomical image processing and analysis....
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creator | Schmid, Michael Kraushofer, Florian Imre, Alexander M Kißlinger, Tilman Hammer, Lutz Diebold, Ulrike Riva, Michele |
description | As part of the ViPErLEED project (Vienna package for Erlangen LEED,
low-energy electron diffraction), computer programs have been developed for
facile and user-friendly data extraction from movies of LEED images. The
programs make use of some concepts from astronomical image processing and
analysis. As a first step, flat-field and dark-frame corrections reduce the
effects of inhomogeneities of the camera and screen. In a second step, for
identifying all diffraction maxima ("spots"), it is sufficient to manually mark
and label a single spot or very few spots. Then the program can automatically
identify all other spots and determine the distortions of the image. This forms
the basis for automatic spot tracking (following the "beams" as they move
across the LEED screen) and intensity measurement. Even for complex structures
with hundreds to a few thousand diffraction beams, this step takes less than a
minute. The package also includes a program for further processing of these
I(V) curves (averaging of equivalent beams, manual and/or automatic selection,
smoothing) as well as several utilities. The software is implemented as a set
of plugins for the public-domain image processing program ImageJ and provided
as an open-source package. |
doi_str_mv | 10.48550/arxiv.2406.18413 |
format | Article |
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low-energy electron diffraction), computer programs have been developed for
facile and user-friendly data extraction from movies of LEED images. The
programs make use of some concepts from astronomical image processing and
analysis. As a first step, flat-field and dark-frame corrections reduce the
effects of inhomogeneities of the camera and screen. In a second step, for
identifying all diffraction maxima ("spots"), it is sufficient to manually mark
and label a single spot or very few spots. Then the program can automatically
identify all other spots and determine the distortions of the image. This forms
the basis for automatic spot tracking (following the "beams" as they move
across the LEED screen) and intensity measurement. Even for complex structures
with hundreds to a few thousand diffraction beams, this step takes less than a
minute. The package also includes a program for further processing of these
I(V) curves (averaging of equivalent beams, manual and/or automatic selection,
smoothing) as well as several utilities. The software is implemented as a set
of plugins for the public-domain image processing program ImageJ and provided
as an open-source package.</description><identifier>DOI: 10.48550/arxiv.2406.18413</identifier><language>eng</language><subject>Physics - Computational Physics ; Physics - Data Analysis, Statistics and Probability ; Physics - Materials Science</subject><creationdate>2024-06</creationdate><rights>http://creativecommons.org/licenses/by/4.0</rights><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>228,230,782,887</link.rule.ids><linktorsrc>$$Uhttps://arxiv.org/abs/2406.18413$$EView_record_in_Cornell_University$$FView_record_in_$$GCornell_University$$Hfree_for_read</linktorsrc><backlink>$$Uhttps://doi.org/10.48550/arXiv.2406.18413$$DView paper in arXiv$$Hfree_for_read</backlink></links><search><creatorcontrib>Schmid, Michael</creatorcontrib><creatorcontrib>Kraushofer, Florian</creatorcontrib><creatorcontrib>Imre, Alexander M</creatorcontrib><creatorcontrib>Kißlinger, Tilman</creatorcontrib><creatorcontrib>Hammer, Lutz</creatorcontrib><creatorcontrib>Diebold, Ulrike</creatorcontrib><creatorcontrib>Riva, Michele</creatorcontrib><title>ViPErLEED package II: Spot tracking, extraction and processing of I(V) curves</title><description>As part of the ViPErLEED project (Vienna package for Erlangen LEED,
low-energy electron diffraction), computer programs have been developed for
facile and user-friendly data extraction from movies of LEED images. The
programs make use of some concepts from astronomical image processing and
analysis. As a first step, flat-field and dark-frame corrections reduce the
effects of inhomogeneities of the camera and screen. In a second step, for
identifying all diffraction maxima ("spots"), it is sufficient to manually mark
and label a single spot or very few spots. Then the program can automatically
identify all other spots and determine the distortions of the image. This forms
the basis for automatic spot tracking (following the "beams" as they move
across the LEED screen) and intensity measurement. Even for complex structures
with hundreds to a few thousand diffraction beams, this step takes less than a
minute. The package also includes a program for further processing of these
I(V) curves (averaging of equivalent beams, manual and/or automatic selection,
smoothing) as well as several utilities. The software is implemented as a set
of plugins for the public-domain image processing program ImageJ and provided
as an open-source package.</description><subject>Physics - Computational Physics</subject><subject>Physics - Data Analysis, Statistics and Probability</subject><subject>Physics - Materials Science</subject><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2024</creationdate><recordtype>article</recordtype><sourceid>GOX</sourceid><recordid>eNotj09Lw0AUxPfiQaofwFPfsYKJm327ydab1KiBFIWWXsPrZrcsahI2sdRvb_rnNMMMDPNj7C7hsdRK8UcKB7-PheRpnGiZ4DVbbvxnHso8f4GOzBftLBTFE6y6doAhjIlvdg9gD0c_-LYBamroQmts348VtA6K2eYezG_Y2_6GXTn67u3tRSds_ZqvF-9R-fFWLJ7LiNIMI63sdu4k57XOjLNqtGRovKNqvcVacYek9DwRmqOQwkqUKWopM65tiiLDCZueZ088VRf8D4W_6shVnbjwH9tZRZ4</recordid><startdate>20240626</startdate><enddate>20240626</enddate><creator>Schmid, Michael</creator><creator>Kraushofer, Florian</creator><creator>Imre, Alexander M</creator><creator>Kißlinger, Tilman</creator><creator>Hammer, Lutz</creator><creator>Diebold, Ulrike</creator><creator>Riva, Michele</creator><scope>GOX</scope></search><sort><creationdate>20240626</creationdate><title>ViPErLEED package II: Spot tracking, extraction and processing of I(V) curves</title><author>Schmid, Michael ; Kraushofer, Florian ; Imre, Alexander M ; Kißlinger, Tilman ; Hammer, Lutz ; Diebold, Ulrike ; Riva, Michele</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-a673-85eb9f400d87cfe5f40aca4135d8b3d50f3a58912803242e43463844708e63273</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2024</creationdate><topic>Physics - Computational Physics</topic><topic>Physics - Data Analysis, Statistics and Probability</topic><topic>Physics - Materials Science</topic><toplevel>online_resources</toplevel><creatorcontrib>Schmid, Michael</creatorcontrib><creatorcontrib>Kraushofer, Florian</creatorcontrib><creatorcontrib>Imre, Alexander M</creatorcontrib><creatorcontrib>Kißlinger, Tilman</creatorcontrib><creatorcontrib>Hammer, Lutz</creatorcontrib><creatorcontrib>Diebold, Ulrike</creatorcontrib><creatorcontrib>Riva, Michele</creatorcontrib><collection>arXiv.org</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Schmid, Michael</au><au>Kraushofer, Florian</au><au>Imre, Alexander M</au><au>Kißlinger, Tilman</au><au>Hammer, Lutz</au><au>Diebold, Ulrike</au><au>Riva, Michele</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>ViPErLEED package II: Spot tracking, extraction and processing of I(V) curves</atitle><date>2024-06-26</date><risdate>2024</risdate><abstract>As part of the ViPErLEED project (Vienna package for Erlangen LEED,
low-energy electron diffraction), computer programs have been developed for
facile and user-friendly data extraction from movies of LEED images. The
programs make use of some concepts from astronomical image processing and
analysis. As a first step, flat-field and dark-frame corrections reduce the
effects of inhomogeneities of the camera and screen. In a second step, for
identifying all diffraction maxima ("spots"), it is sufficient to manually mark
and label a single spot or very few spots. Then the program can automatically
identify all other spots and determine the distortions of the image. This forms
the basis for automatic spot tracking (following the "beams" as they move
across the LEED screen) and intensity measurement. Even for complex structures
with hundreds to a few thousand diffraction beams, this step takes less than a
minute. The package also includes a program for further processing of these
I(V) curves (averaging of equivalent beams, manual and/or automatic selection,
smoothing) as well as several utilities. The software is implemented as a set
of plugins for the public-domain image processing program ImageJ and provided
as an open-source package.</abstract><doi>10.48550/arxiv.2406.18413</doi><oa>free_for_read</oa></addata></record> |
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subjects | Physics - Computational Physics Physics - Data Analysis, Statistics and Probability Physics - Materials Science |
title | ViPErLEED package II: Spot tracking, extraction and processing of I(V) curves |
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