Pauli Noise Learning for Mid-Circuit Measurements

Current benchmarks for mid-circuit measurements (MCMs) are limited in scalability or the types of error they can quantify, necessitating new techniques for quantifying their performance. Here, we introduce a theory for learning Pauli noise in MCMs and use it to create MCM cycle benchmarking, a scala...

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Hauptverfasser: Hines, Jordan, Proctor, Timothy
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Sprache:eng
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