The Penalized Inverse Probability Measure for Conformal Classification

IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), IEEE/CVF, Jun 2024, Seattle, United States The deployment of safe and trustworthy machine learning systems, and particularly complex black box neural networks, in real-world applications requires reliable and certified guarantees...

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Hauptverfasser:	Melki, Paul, Bombrun, Lionel, Diallo, Boubacar, Dias, Jérôme, da Costa, Jean-Pierre
Format:	Artikel
Sprache:	eng
Schlagworte:	Computer Science - Computer Vision and Pattern Recognition Computer Science - Learning Statistics - Machine Learning
Online-Zugang:	Volltext bestellen
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