Demonstrating repetitive non-destructive readout (RNDR) with SiSeRO devices

We demonstrate so-called repetitive non-destructive readout (RNDR) for the first time on a Single electron Sensitive Readout (SiSeRO) device. SiSeRO is a novel on-chip charge detector output stage for charge-coupled device (CCD) image sensors, developed at MIT Lincoln Laboratory. This technology use...

Ausführliche Beschreibung

Bibliographische Detailangaben

Veröffentlicht in:	arXiv.org 2023-12
Hauptverfasser:	Chattopadhyay, Tanmoy, Herrmann, Sven, Orel, Peter, Donlon, Kevan, Prigozhin, Gregory, Morris, R Glenn, Cooper, Michael, LaMarr, Beverly, Malonis, Andrew, Allen, Steven W, Bautz, Marshall W, Leitz, Chris
Format:	Artikel
Sprache:	eng
Schlagworte:	Charge coupled devices Extreme values Noise reduction Noise sensitivity Physics - High Energy Astrophysical Phenomena Physics - Instrumentation and Methods for Astrophysics Semiconductor devices Single electrons Spectral resolution Spectroscopic telescopes Temperature control Transistors X ray telescopes
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!