A Compensated Design of the LGAD Gain Layer

In this contribution, we present an innovative design of the Low-Gain Avalanche Diode (LGAD) gain layer, the p\(^+\) implant responsible for the local and controlled signal multiplication. In the standard LGAD design, the gain layer is obtained by implanting \(\sim\) 5E16/cm\(^3\) atoms of an accept...

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Hauptverfasser: Sola, Valentina, Arcidiacono, Roberta, Asenov, Patrick, Borghi, Giacomo, Boscardin, Maurizio, Cartiglia, Nicolò, Vignali, Matteo Centis, Croci, Tommaso, Ferrero, Marco, Fondacci, Alessandro, Gioachin, Giulia, Giordanengo, Simona, Lantieri, Leonardo, Mandurrino, Marco, Menzio, Luca, Monaco, Vincenzo, Morozzi, Arianna, Moscatelli, Francesco, Passeri, Daniele, Pastrone, Nadia, Paternoster, Giovanni, Siviero, Federico, Staiano, Amedeo, Tornago, Marta
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creator Sola, Valentina
Arcidiacono, Roberta
Asenov, Patrick
Borghi, Giacomo
Boscardin, Maurizio
Cartiglia, Nicolò
Vignali, Matteo Centis
Croci, Tommaso
Ferrero, Marco
Fondacci, Alessandro
Gioachin, Giulia
Giordanengo, Simona
Lantieri, Leonardo
Mandurrino, Marco
Menzio, Luca
Monaco, Vincenzo
Morozzi, Arianna
Moscatelli, Francesco
Passeri, Daniele
Pastrone, Nadia
Paternoster, Giovanni
Siviero, Federico
Staiano, Amedeo
Tornago, Marta
description In this contribution, we present an innovative design of the Low-Gain Avalanche Diode (LGAD) gain layer, the p\(^+\) implant responsible for the local and controlled signal multiplication. In the standard LGAD design, the gain layer is obtained by implanting \(\sim\) 5E16/cm\(^3\) atoms of an acceptor material, typically Boron or Gallium, in the region below the n\(^{++}\) electrode. In our design, we aim at designing a gain layer resulting from the overlap of a p\(^+\) and an n\(^+\) implants: the difference between acceptor and donor doping will result in an effective concentration of about 5E16/cm\(^3\), similar to standard LGADs. At present, the gain mechanism of LGAD sensors under irradiation is maintained up to a fluence of \(\sim\) 1-2E15/cm\(^2\), and then it is lost due to the acceptor removal mechanism. The new design will be more resilient to radiation, as both acceptor and donor atoms will undergo removal with irradiation, but their difference will maintain constant. The compensated design will empower the 4D tracking ability typical of the LGAD sensors well above 1E16/cm\(^2\).
doi_str_mv 10.48550/arxiv.2209.00494
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subjects Acceptor materials
Avalanche diodes
Design standards
Fluence
Gallium
Irradiation
Physics - Instrumentation and Detectors
Sensors
Transplants & implants
title A Compensated Design of the LGAD Gain Layer
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