ASOCEM: Automatic Segmentation Of Contaminations in cryo-EM
Particle picking is currently a critical step in the cryo-electron microscopy single particle reconstruction pipeline. Contaminations in the acquired micrographs severely degrade the performance of particle pickers, resulting is many ``non-particles'' in the collected stack of particles. I...
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creator | Eldar, Amitay Amos, Ido Shkolnisky, Yoel |
description | Particle picking is currently a critical step in the cryo-electron microscopy
single particle reconstruction pipeline. Contaminations in the acquired
micrographs severely degrade the performance of particle pickers, resulting is
many ``non-particles'' in the collected stack of particles. In this paper, we
present ASOCEM (Automatic Segmentation Of Contaminations in cryo-EM), an
automatic method to detect and segment contaminations, which requires as an
input only the approximated particle size. In particular, it does not require
any parameter tuning nor manual intervention. Our method is based on the
observation that the statistical distribution of contaminated regions is
different from that of the rest of the micrograph. This nonrestrictive
assumption allows to automatically detect various types of contaminations, from
the carbon edges of the supporting grid to high contrast blobs of different
sizes. We demonstrate the efficiency of our algorithm using various
experimental data sets containing various types of contaminations. ASOCEM is
integrated as part of the KLT picker \cite{ELDAR2020107473} and is available at
\url{https://github.com/ShkolniskyLab/kltpicker2}. |
doi_str_mv | 10.48550/arxiv.2201.06978 |
format | Article |
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single particle reconstruction pipeline. Contaminations in the acquired
micrographs severely degrade the performance of particle pickers, resulting is
many ``non-particles'' in the collected stack of particles. In this paper, we
present ASOCEM (Automatic Segmentation Of Contaminations in cryo-EM), an
automatic method to detect and segment contaminations, which requires as an
input only the approximated particle size. In particular, it does not require
any parameter tuning nor manual intervention. Our method is based on the
observation that the statistical distribution of contaminated regions is
different from that of the rest of the micrograph. This nonrestrictive
assumption allows to automatically detect various types of contaminations, from
the carbon edges of the supporting grid to high contrast blobs of different
sizes. We demonstrate the efficiency of our algorithm using various
experimental data sets containing various types of contaminations. ASOCEM is
integrated as part of the KLT picker \cite{ELDAR2020107473} and is available at
\url{https://github.com/ShkolniskyLab/kltpicker2}.</description><identifier>DOI: 10.48550/arxiv.2201.06978</identifier><language>eng</language><subject>Computer Science - Computer Vision and Pattern Recognition ; Statistics - Applications</subject><creationdate>2022-01</creationdate><rights>http://creativecommons.org/licenses/by-nc-nd/4.0</rights><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>228,230,776,881</link.rule.ids><linktorsrc>$$Uhttps://arxiv.org/abs/2201.06978$$EView_record_in_Cornell_University$$FView_record_in_$$GCornell_University$$Hfree_for_read</linktorsrc><backlink>$$Uhttps://doi.org/10.48550/arXiv.2201.06978$$DView paper in arXiv$$Hfree_for_read</backlink></links><search><creatorcontrib>Eldar, Amitay</creatorcontrib><creatorcontrib>Amos, Ido</creatorcontrib><creatorcontrib>Shkolnisky, Yoel</creatorcontrib><title>ASOCEM: Automatic Segmentation Of Contaminations in cryo-EM</title><description>Particle picking is currently a critical step in the cryo-electron microscopy
single particle reconstruction pipeline. Contaminations in the acquired
micrographs severely degrade the performance of particle pickers, resulting is
many ``non-particles'' in the collected stack of particles. In this paper, we
present ASOCEM (Automatic Segmentation Of Contaminations in cryo-EM), an
automatic method to detect and segment contaminations, which requires as an
input only the approximated particle size. In particular, it does not require
any parameter tuning nor manual intervention. Our method is based on the
observation that the statistical distribution of contaminated regions is
different from that of the rest of the micrograph. This nonrestrictive
assumption allows to automatically detect various types of contaminations, from
the carbon edges of the supporting grid to high contrast blobs of different
sizes. We demonstrate the efficiency of our algorithm using various
experimental data sets containing various types of contaminations. ASOCEM is
integrated as part of the KLT picker \cite{ELDAR2020107473} and is available at
\url{https://github.com/ShkolniskyLab/kltpicker2}.</description><subject>Computer Science - Computer Vision and Pattern Recognition</subject><subject>Statistics - Applications</subject><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2022</creationdate><recordtype>article</recordtype><sourceid>GOX</sourceid><recordid>eNotj71uwjAUhb0wVMADdMIvkHB9jW8cmKIopZVAGWCPbl2nstQkKAQEb19IO52f4eh8QrwqiFfWGFhyfwvXGBFUDJQm9kVsskOZF_u1zC5D1_AQnDz478a3w8N3rSxrmXeP0IR2LM4ytNL19y4q9jMxqfnn7Of_OhXHt-KYv0e7cvuRZ7uIKbERf9begyUiVF_GqxqBFYJxGi2vHHhiw-hdmhiFRlvUSEYnYBUxUop6KhZ_s-P76tSHhvt79aSoRgr9C5lsP6s</recordid><startdate>20220118</startdate><enddate>20220118</enddate><creator>Eldar, Amitay</creator><creator>Amos, Ido</creator><creator>Shkolnisky, Yoel</creator><scope>AKY</scope><scope>EPD</scope><scope>GOX</scope></search><sort><creationdate>20220118</creationdate><title>ASOCEM: Automatic Segmentation Of Contaminations in cryo-EM</title><author>Eldar, Amitay ; Amos, Ido ; Shkolnisky, Yoel</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-a678-abfee0866621d5e1f20a1205c328a4c0e6a5a2ec9751253823265370816a26923</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2022</creationdate><topic>Computer Science - Computer Vision and Pattern Recognition</topic><topic>Statistics - Applications</topic><toplevel>online_resources</toplevel><creatorcontrib>Eldar, Amitay</creatorcontrib><creatorcontrib>Amos, Ido</creatorcontrib><creatorcontrib>Shkolnisky, Yoel</creatorcontrib><collection>arXiv Computer Science</collection><collection>arXiv Statistics</collection><collection>arXiv.org</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Eldar, Amitay</au><au>Amos, Ido</au><au>Shkolnisky, Yoel</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>ASOCEM: Automatic Segmentation Of Contaminations in cryo-EM</atitle><date>2022-01-18</date><risdate>2022</risdate><abstract>Particle picking is currently a critical step in the cryo-electron microscopy
single particle reconstruction pipeline. Contaminations in the acquired
micrographs severely degrade the performance of particle pickers, resulting is
many ``non-particles'' in the collected stack of particles. In this paper, we
present ASOCEM (Automatic Segmentation Of Contaminations in cryo-EM), an
automatic method to detect and segment contaminations, which requires as an
input only the approximated particle size. In particular, it does not require
any parameter tuning nor manual intervention. Our method is based on the
observation that the statistical distribution of contaminated regions is
different from that of the rest of the micrograph. This nonrestrictive
assumption allows to automatically detect various types of contaminations, from
the carbon edges of the supporting grid to high contrast blobs of different
sizes. We demonstrate the efficiency of our algorithm using various
experimental data sets containing various types of contaminations. ASOCEM is
integrated as part of the KLT picker \cite{ELDAR2020107473} and is available at
\url{https://github.com/ShkolniskyLab/kltpicker2}.</abstract><doi>10.48550/arxiv.2201.06978</doi><oa>free_for_read</oa></addata></record> |
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subjects | Computer Science - Computer Vision and Pattern Recognition Statistics - Applications |
title | ASOCEM: Automatic Segmentation Of Contaminations in cryo-EM |
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