Probabilistic Verification for Reliability of a Two-by-Two Network-on-Chip System

Modern network-on-chip (NoC) systems face reliability issues due to process and environmental variations. The power supply noise (PSN) in the power delivery network of a NoC plays a key role in determining reliability. PSN leads to voltage droop, which can cause timing errors in the NoC. This paper...

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Hauptverfasser: Roberts, Riley, Lewis, Benjamin, Hartmanns, Arnd, Basu, Prabal, Roy, Sanghamitra, Chakraborty, Koushik, Zhang, Zhen
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Sprache:eng
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