Multi defect detection and analysis of electron microscopy images with deep learning
Electron microscopy is widely used to explore defects in crystal structures, but human detecting of defects is often time-consuming, error-prone, and unreliable, and is not scalable to large numbers of images or real-time analysis. In this work, we discuss the application of machine learning approac...
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| creator | Shen, Mingren Li, Guanzhao Wu, Dongxia Liu, Yuhan Greaves, Jacob Hao, Wei Krakauer, Nathaniel J Krudy, Leah Perez, Jacob Sreenivasan, Varun Sanchez, Bryan Torres, Oigimer Li, Wei Field, Kevin Morgan, Dane |
| description | Electron microscopy is widely used to explore defects in crystal structures, but human detecting of defects is often time-consuming, error-prone, and unreliable, and is not scalable to large numbers of images or real-time analysis. In this work, we discuss the application of machine learning approaches to find the location and geometry of different defect clusters in irradiated steels. We show that a deep learning based Faster R-CNN analysis system has a performance comparable to human analysis with relatively small training data sets. This study proves the promising ability to apply deep learning to assist the development of automated microscopy data analysis even when multiple features are present and paves the way for fast, scalable, and reliable analysis systems for massive amounts of modern electron microscopy data. |
| doi_str_mv | 10.48550/arxiv.2108.08883 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_arxiv</sourceid><recordid>TN_cdi_arxiv_primary_2108_08883</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2563940413</sourcerecordid><originalsourceid>FETCH-LOGICAL-a523-e3cb18023e4e4202d73f2c31bf8752061b5fa81786050c97d1c5f430fcbe4b053</originalsourceid><addsrcrecordid>eNotj8tOwzAQRS0kJKrSD2CFJdYJY4-duEtU8ZKK2GQfOY5dXKVJsBOgf49pWYzO4t4ZzSHkhkEulJRwr8OP_8o5A5WDUgovyIIjskwJzq_IKsY9APCi5FLiglRvczd52lpnzZQwJfihp7pv0-juGH2kg6O2S0FIwcGbMEQzjEfqD3pnI_3200fatCPtrA6973fX5NLpLtrVP5ekenqsNi_Z9v35dfOwzbTkmFk0DVPA0QorOPC2RMcNssapUnIoWCOdVqxUBUgw67JlRjqB4ExjRQMSl-T2fPakXI8hPRSO9Z96fVJPjbtzYwzD52zjVO-HOSStWHNZ4FqAYIi_PMxcDw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2563940413</pqid></control><display><type>article</type><title>Multi defect detection and analysis of electron microscopy images with deep learning</title><source>arXiv.org</source><source>Free E- Journals</source><creator>Shen, Mingren ; Li, Guanzhao ; Wu, Dongxia ; Liu, Yuhan ; Greaves, Jacob ; Hao, Wei ; Krakauer, Nathaniel J ; Krudy, Leah ; Perez, Jacob ; Sreenivasan, Varun ; Sanchez, Bryan ; Torres, Oigimer ; Li, Wei ; Field, Kevin ; Morgan, Dane</creator><creatorcontrib>Shen, Mingren ; Li, Guanzhao ; Wu, Dongxia ; Liu, Yuhan ; Greaves, Jacob ; Hao, Wei ; Krakauer, Nathaniel J ; Krudy, Leah ; Perez, Jacob ; Sreenivasan, Varun ; Sanchez, Bryan ; Torres, Oigimer ; Li, Wei ; Field, Kevin ; Morgan, Dane</creatorcontrib><description>Electron microscopy is widely used to explore defects in crystal structures, but human detecting of defects is often time-consuming, error-prone, and unreliable, and is not scalable to large numbers of images or real-time analysis. In this work, we discuss the application of machine learning approaches to find the location and geometry of different defect clusters in irradiated steels. We show that a deep learning based Faster R-CNN analysis system has a performance comparable to human analysis with relatively small training data sets. This study proves the promising ability to apply deep learning to assist the development of automated microscopy data analysis even when multiple features are present and paves the way for fast, scalable, and reliable analysis systems for massive amounts of modern electron microscopy data.</description><identifier>EISSN: 2331-8422</identifier><identifier>DOI: 10.48550/arxiv.2108.08883</identifier><language>eng</language><publisher>Ithaca: Cornell University Library, arXiv.org</publisher><subject>Computer Science - Computer Vision and Pattern Recognition ; Crystal defects ; Crystal structure ; Data analysis ; Deep learning ; Electron microscopy ; Human performance ; Machine learning ; Microscopy ; Physics - Materials Science</subject><ispartof>arXiv.org, 2021-08</ispartof><rights>2021. This work is published under http://creativecommons.org/licenses/by/4.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.</rights><rights>http://creativecommons.org/licenses/by/4.0</rights><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>228,230,776,780,881,27902</link.rule.ids><backlink>$$Uhttps://doi.org/10.1016/j.commatsci.2021.110576$$DView published paper (Access to full text may be restricted)$$Hfree_for_read</backlink><backlink>$$Uhttps://doi.org/10.48550/arXiv.2108.08883$$DView paper in arXiv$$Hfree_for_read</backlink></links><search><creatorcontrib>Shen, Mingren</creatorcontrib><creatorcontrib>Li, Guanzhao</creatorcontrib><creatorcontrib>Wu, Dongxia</creatorcontrib><creatorcontrib>Liu, Yuhan</creatorcontrib><creatorcontrib>Greaves, Jacob</creatorcontrib><creatorcontrib>Hao, Wei</creatorcontrib><creatorcontrib>Krakauer, Nathaniel J</creatorcontrib><creatorcontrib>Krudy, Leah</creatorcontrib><creatorcontrib>Perez, Jacob</creatorcontrib><creatorcontrib>Sreenivasan, Varun</creatorcontrib><creatorcontrib>Sanchez, Bryan</creatorcontrib><creatorcontrib>Torres, Oigimer</creatorcontrib><creatorcontrib>Li, Wei</creatorcontrib><creatorcontrib>Field, Kevin</creatorcontrib><creatorcontrib>Morgan, Dane</creatorcontrib><title>Multi defect detection and analysis of electron microscopy images with deep learning</title><title>arXiv.org</title><description>Electron microscopy is widely used to explore defects in crystal structures, but human detecting of defects is often time-consuming, error-prone, and unreliable, and is not scalable to large numbers of images or real-time analysis. In this work, we discuss the application of machine learning approaches to find the location and geometry of different defect clusters in irradiated steels. We show that a deep learning based Faster R-CNN analysis system has a performance comparable to human analysis with relatively small training data sets. This study proves the promising ability to apply deep learning to assist the development of automated microscopy data analysis even when multiple features are present and paves the way for fast, scalable, and reliable analysis systems for massive amounts of modern electron microscopy data.</description><subject>Computer Science - Computer Vision and Pattern Recognition</subject><subject>Crystal defects</subject><subject>Crystal structure</subject><subject>Data analysis</subject><subject>Deep learning</subject><subject>Electron microscopy</subject><subject>Human performance</subject><subject>Machine learning</subject><subject>Microscopy</subject><subject>Physics - Materials Science</subject><issn>2331-8422</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2021</creationdate><recordtype>article</recordtype><sourceid>BENPR</sourceid><sourceid>GOX</sourceid><recordid>eNotj8tOwzAQRS0kJKrSD2CFJdYJY4-duEtU8ZKK2GQfOY5dXKVJsBOgf49pWYzO4t4ZzSHkhkEulJRwr8OP_8o5A5WDUgovyIIjskwJzq_IKsY9APCi5FLiglRvczd52lpnzZQwJfihp7pv0-juGH2kg6O2S0FIwcGbMEQzjEfqD3pnI_3200fatCPtrA6973fX5NLpLtrVP5ekenqsNi_Z9v35dfOwzbTkmFk0DVPA0QorOPC2RMcNssapUnIoWCOdVqxUBUgw67JlRjqB4ExjRQMSl-T2fPakXI8hPRSO9Z96fVJPjbtzYwzD52zjVO-HOSStWHNZ4FqAYIi_PMxcDw</recordid><startdate>20210819</startdate><enddate>20210819</enddate><creator>Shen, Mingren</creator><creator>Li, Guanzhao</creator><creator>Wu, Dongxia</creator><creator>Liu, Yuhan</creator><creator>Greaves, Jacob</creator><creator>Hao, Wei</creator><creator>Krakauer, Nathaniel J</creator><creator>Krudy, Leah</creator><creator>Perez, Jacob</creator><creator>Sreenivasan, Varun</creator><creator>Sanchez, Bryan</creator><creator>Torres, Oigimer</creator><creator>Li, Wei</creator><creator>Field, Kevin</creator><creator>Morgan, Dane</creator><general>Cornell University Library, arXiv.org</general><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>HCIFZ</scope><scope>L6V</scope><scope>M7S</scope><scope>PIMPY</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>PTHSS</scope><scope>AKY</scope><scope>GOX</scope></search><sort><creationdate>20210819</creationdate><title>Multi defect detection and analysis of electron microscopy images with deep learning</title><author>Shen, Mingren ; Li, Guanzhao ; Wu, Dongxia ; Liu, Yuhan ; Greaves, Jacob ; Hao, Wei ; Krakauer, Nathaniel J ; Krudy, Leah ; Perez, Jacob ; Sreenivasan, Varun ; Sanchez, Bryan ; Torres, Oigimer ; Li, Wei ; Field, Kevin ; Morgan, Dane</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-a523-e3cb18023e4e4202d73f2c31bf8752061b5fa81786050c97d1c5f430fcbe4b053</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2021</creationdate><topic>Computer Science - Computer Vision and Pattern Recognition</topic><topic>Crystal defects</topic><topic>Crystal structure</topic><topic>Data analysis</topic><topic>Deep learning</topic><topic>Electron microscopy</topic><topic>Human performance</topic><topic>Machine learning</topic><topic>Microscopy</topic><topic>Physics - Materials Science</topic><toplevel>online_resources</toplevel><creatorcontrib>Shen, Mingren</creatorcontrib><creatorcontrib>Li, Guanzhao</creatorcontrib><creatorcontrib>Wu, Dongxia</creatorcontrib><creatorcontrib>Liu, Yuhan</creatorcontrib><creatorcontrib>Greaves, Jacob</creatorcontrib><creatorcontrib>Hao, Wei</creatorcontrib><creatorcontrib>Krakauer, Nathaniel J</creatorcontrib><creatorcontrib>Krudy, Leah</creatorcontrib><creatorcontrib>Perez, Jacob</creatorcontrib><creatorcontrib>Sreenivasan, Varun</creatorcontrib><creatorcontrib>Sanchez, Bryan</creatorcontrib><creatorcontrib>Torres, Oigimer</creatorcontrib><creatorcontrib>Li, Wei</creatorcontrib><creatorcontrib>Field, Kevin</creatorcontrib><creatorcontrib>Morgan, Dane</creatorcontrib><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central UK/Ireland</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>SciTech Premium Collection</collection><collection>ProQuest Engineering Collection</collection><collection>Engineering Database</collection><collection>Publicly Available Content Database</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>Engineering Collection</collection><collection>arXiv Computer Science</collection><collection>arXiv.org</collection><jtitle>arXiv.org</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Shen, Mingren</au><au>Li, Guanzhao</au><au>Wu, Dongxia</au><au>Liu, Yuhan</au><au>Greaves, Jacob</au><au>Hao, Wei</au><au>Krakauer, Nathaniel J</au><au>Krudy, Leah</au><au>Perez, Jacob</au><au>Sreenivasan, Varun</au><au>Sanchez, Bryan</au><au>Torres, Oigimer</au><au>Li, Wei</au><au>Field, Kevin</au><au>Morgan, Dane</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Multi defect detection and analysis of electron microscopy images with deep learning</atitle><jtitle>arXiv.org</jtitle><date>2021-08-19</date><risdate>2021</risdate><eissn>2331-8422</eissn><abstract>Electron microscopy is widely used to explore defects in crystal structures, but human detecting of defects is often time-consuming, error-prone, and unreliable, and is not scalable to large numbers of images or real-time analysis. In this work, we discuss the application of machine learning approaches to find the location and geometry of different defect clusters in irradiated steels. We show that a deep learning based Faster R-CNN analysis system has a performance comparable to human analysis with relatively small training data sets. This study proves the promising ability to apply deep learning to assist the development of automated microscopy data analysis even when multiple features are present and paves the way for fast, scalable, and reliable analysis systems for massive amounts of modern electron microscopy data.</abstract><cop>Ithaca</cop><pub>Cornell University Library, arXiv.org</pub><doi>10.48550/arxiv.2108.08883</doi><oa>free_for_read</oa></addata></record> |
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| subjects | Computer Science - Computer Vision and Pattern Recognition Crystal defects Crystal structure Data analysis Deep learning Electron microscopy Human performance Machine learning Microscopy Physics - Materials Science |
| title | Multi defect detection and analysis of electron microscopy images with deep learning |
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