Ferroelectricity in AlScN: Switching, Imprint and sub-150 nm Films

The discovery of ferroelectricity in AlScN allowed the first clear observation of the effect in the wurtzite crystal structure, resulting in a material with a previously unprecedented combination of very large coercive fields (2-5 MV/cm) and remnant polarizations (70-110 ${\mu}$C/cm$^2$). We obtaine...

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Hauptverfasser: Fichtner, Simon, Schönweger, Georg, Kreutzer, Tom-Niklas, Lofink, Fabian, Petraru, Adrian, Kohlstedt, Hermann, Wagner, Bernhard
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Schönweger, Georg
Kreutzer, Tom-Niklas
Lofink, Fabian
Petraru, Adrian
Kohlstedt, Hermann
Wagner, Bernhard
description The discovery of ferroelectricity in AlScN allowed the first clear observation of the effect in the wurtzite crystal structure, resulting in a material with a previously unprecedented combination of very large coercive fields (2-5 MV/cm) and remnant polarizations (70-110 ${\mu}$C/cm$^2$). We obtained initial insight into the switching dynamics of AlScN, which suggests a domain wall motion limited process progressing from the electrode interfaces. Further, imprint was generally observed in AlScN films and can tentatively be traced to the alignment of charged defects with the internal and external polarization and field, respectively. Potentially crucial from the application point of view, ferroelectricity could be observed in films with thicknesses below 30 nm - as the coercive fields of AlScN were found to be largely independent of thickness between 600 nm and 27 nm.
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fullrecord <record><control><sourceid>arxiv_GOX</sourceid><recordid>TN_cdi_arxiv_primary_2010_05705</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2010_05705</sourcerecordid><originalsourceid>FETCH-LOGICAL-a675-df063525645853bbfeb83d658f3f068ee8a742330da0c33fff3ee16155c6541e3</originalsourceid><addsrcrecordid>eNotj8FOwzAQRH3pARU-gBP-AFLW2axjcStVA5UqOLT3yHHWYClxkZMC_XtC6WmkGelpnhC3ChaFIYIHm37C1yKHqQAqga7EU8UpHbhjN6bgwniSIcplt3Ovj3L3HUb3EeL7vdz0nynEUdrYyuHYZIpAxl5WoeuHazHzthv45pJzsa_W-9VLtn173qyW28zqkrLWg0bKSRdkCJvGc2Ow1WQ8TothNrYsckRoLThE7z0yK62InKZCMc7F3T_2LFFPf3qbTvWfTH2WwV_Bh0LB</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Ferroelectricity in AlScN: Switching, Imprint and sub-150 nm Films</title><source>arXiv.org</source><creator>Fichtner, Simon ; Schönweger, Georg ; Kreutzer, Tom-Niklas ; Lofink, Fabian ; Petraru, Adrian ; Kohlstedt, Hermann ; Wagner, Bernhard</creator><creatorcontrib>Fichtner, Simon ; Schönweger, Georg ; Kreutzer, Tom-Niklas ; Lofink, Fabian ; Petraru, Adrian ; Kohlstedt, Hermann ; Wagner, Bernhard</creatorcontrib><description>The discovery of ferroelectricity in AlScN allowed the first clear observation of the effect in the wurtzite crystal structure, resulting in a material with a previously unprecedented combination of very large coercive fields (2-5 MV/cm) and remnant polarizations (70-110 ${\mu}$C/cm$^2$). We obtained initial insight into the switching dynamics of AlScN, which suggests a domain wall motion limited process progressing from the electrode interfaces. Further, imprint was generally observed in AlScN films and can tentatively be traced to the alignment of charged defects with the internal and external polarization and field, respectively. Potentially crucial from the application point of view, ferroelectricity could be observed in films with thicknesses below 30 nm - as the coercive fields of AlScN were found to be largely independent of thickness between 600 nm and 27 nm.</description><identifier>DOI: 10.48550/arxiv.2010.05705</identifier><language>eng</language><subject>Physics - Materials Science</subject><creationdate>2020-10</creationdate><rights>http://arxiv.org/licenses/nonexclusive-distrib/1.0</rights><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>228,230,780,885</link.rule.ids><linktorsrc>$$Uhttps://arxiv.org/abs/2010.05705$$EView_record_in_Cornell_University$$FView_record_in_$$GCornell_University$$Hfree_for_read</linktorsrc><backlink>$$Uhttps://doi.org/10.48550/arXiv.2010.05705$$DView paper in arXiv$$Hfree_for_read</backlink></links><search><creatorcontrib>Fichtner, Simon</creatorcontrib><creatorcontrib>Schönweger, Georg</creatorcontrib><creatorcontrib>Kreutzer, Tom-Niklas</creatorcontrib><creatorcontrib>Lofink, Fabian</creatorcontrib><creatorcontrib>Petraru, Adrian</creatorcontrib><creatorcontrib>Kohlstedt, Hermann</creatorcontrib><creatorcontrib>Wagner, Bernhard</creatorcontrib><title>Ferroelectricity in AlScN: Switching, Imprint and sub-150 nm Films</title><description>The discovery of ferroelectricity in AlScN allowed the first clear observation of the effect in the wurtzite crystal structure, resulting in a material with a previously unprecedented combination of very large coercive fields (2-5 MV/cm) and remnant polarizations (70-110 ${\mu}$C/cm$^2$). We obtained initial insight into the switching dynamics of AlScN, which suggests a domain wall motion limited process progressing from the electrode interfaces. Further, imprint was generally observed in AlScN films and can tentatively be traced to the alignment of charged defects with the internal and external polarization and field, respectively. Potentially crucial from the application point of view, ferroelectricity could be observed in films with thicknesses below 30 nm - as the coercive fields of AlScN were found to be largely independent of thickness between 600 nm and 27 nm.</description><subject>Physics - Materials Science</subject><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2020</creationdate><recordtype>article</recordtype><sourceid>GOX</sourceid><recordid>eNotj8FOwzAQRH3pARU-gBP-AFLW2axjcStVA5UqOLT3yHHWYClxkZMC_XtC6WmkGelpnhC3ChaFIYIHm37C1yKHqQAqga7EU8UpHbhjN6bgwniSIcplt3Ovj3L3HUb3EeL7vdz0nynEUdrYyuHYZIpAxl5WoeuHazHzthv45pJzsa_W-9VLtn173qyW28zqkrLWg0bKSRdkCJvGc2Ow1WQ8TothNrYsckRoLThE7z0yK62InKZCMc7F3T_2LFFPf3qbTvWfTH2WwV_Bh0LB</recordid><startdate>20201012</startdate><enddate>20201012</enddate><creator>Fichtner, Simon</creator><creator>Schönweger, Georg</creator><creator>Kreutzer, Tom-Niklas</creator><creator>Lofink, Fabian</creator><creator>Petraru, Adrian</creator><creator>Kohlstedt, Hermann</creator><creator>Wagner, Bernhard</creator><scope>GOX</scope></search><sort><creationdate>20201012</creationdate><title>Ferroelectricity in AlScN: Switching, Imprint and sub-150 nm Films</title><author>Fichtner, Simon ; Schönweger, Georg ; Kreutzer, Tom-Niklas ; Lofink, Fabian ; Petraru, Adrian ; Kohlstedt, Hermann ; Wagner, Bernhard</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-a675-df063525645853bbfeb83d658f3f068ee8a742330da0c33fff3ee16155c6541e3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2020</creationdate><topic>Physics - Materials Science</topic><toplevel>online_resources</toplevel><creatorcontrib>Fichtner, Simon</creatorcontrib><creatorcontrib>Schönweger, Georg</creatorcontrib><creatorcontrib>Kreutzer, Tom-Niklas</creatorcontrib><creatorcontrib>Lofink, Fabian</creatorcontrib><creatorcontrib>Petraru, Adrian</creatorcontrib><creatorcontrib>Kohlstedt, Hermann</creatorcontrib><creatorcontrib>Wagner, Bernhard</creatorcontrib><collection>arXiv.org</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Fichtner, Simon</au><au>Schönweger, Georg</au><au>Kreutzer, Tom-Niklas</au><au>Lofink, Fabian</au><au>Petraru, Adrian</au><au>Kohlstedt, Hermann</au><au>Wagner, Bernhard</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Ferroelectricity in AlScN: Switching, Imprint and sub-150 nm Films</atitle><date>2020-10-12</date><risdate>2020</risdate><abstract>The discovery of ferroelectricity in AlScN allowed the first clear observation of the effect in the wurtzite crystal structure, resulting in a material with a previously unprecedented combination of very large coercive fields (2-5 MV/cm) and remnant polarizations (70-110 ${\mu}$C/cm$^2$). We obtained initial insight into the switching dynamics of AlScN, which suggests a domain wall motion limited process progressing from the electrode interfaces. Further, imprint was generally observed in AlScN films and can tentatively be traced to the alignment of charged defects with the internal and external polarization and field, respectively. Potentially crucial from the application point of view, ferroelectricity could be observed in films with thicknesses below 30 nm - as the coercive fields of AlScN were found to be largely independent of thickness between 600 nm and 27 nm.</abstract><doi>10.48550/arxiv.2010.05705</doi><oa>free_for_read</oa></addata></record>
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title Ferroelectricity in AlScN: Switching, Imprint and sub-150 nm Films
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-29T09%3A29%3A30IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-arxiv_GOX&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Ferroelectricity%20in%20AlScN:%20Switching,%20Imprint%20and%20sub-150%20nm%20Films&rft.au=Fichtner,%20Simon&rft.date=2020-10-12&rft_id=info:doi/10.48550/arxiv.2010.05705&rft_dat=%3Carxiv_GOX%3E2010_05705%3C/arxiv_GOX%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true